Special Issue "X-ray Imaging in Materials Science"


A special issue of Materials (ISSN 1996-1944).

Deadline for manuscript submissions: closed (31 August 2012)

Special Issue Editor

Guest Editor
Prof. Dr. Jung Ho Je
Department of Materials Science and Engineering, Pohang University of Science and Technology, San 31 Hyojadong, Pohang, 790-784, Korea
Website: http://xic.postech.ac.kr/
E-Mail: jhje@postech.ac.kr
Phone: +82 54 279 2143
Fax: +82 54 279 2992
Interests: hydrogels; polymeric microstructures; silicon wafer; silicon carbide; surface treatment of water; microradiology; microtomography

Special Issue Information

Dear Colleagues,

The theme of this special issue is X-ray Imaging that focuses on instrumentation and application of X-ray microscopy in materials science. X-ray imaging with recent improvements in sources and optics is rapidly expanding in research and science of various materials including soft materials, condensed-matter materials, biomaterials, nanomaterials, etc.

This issue of Materials covers current advances in X-ray imaging techniques such as phase-contrast imaging, coherent diffraction imaging, tomography, topography, and their applications to materials science. Perspectives are welcome on upcoming new techniques or facilities, especially X-ray free-electron laser (XFEL), which will greatly extend X-ray imaging to femtosecond time domain and to interatomic length scales. Finally, we encourage considering a variety of X-ray-induced interactions, which become important for the synthesis of new materials, for the discovery of new phenomenon, or for the prevention of radiation damages, since material properties could be significantly changed with X-ray irradiation.

Prof. Dr. Jung Ho Je
Guest Editor


  • X-ray imaging
  • X-ray microscopy
  • Coherent diffraction imaging
  • Phase contrast imaging
  • X-ray optics
  • XFEL
  • Tomography
  • Topography
  • X-ray-induced phenomena

Published Papers (4 papers)

Materials 2012, 5(11), 2353-2359; doi:10.3390/ma5112353
Received: 21 September 2012; in revised form: 24 October 2012 / Accepted: 12 November 2012 / Published: 16 November 2012
Show/Hide Abstract | Download PDF Full-text (1303 KB)

Materials 2012, 5(10), 1752-1773; doi:10.3390/ma5101752
Received: 9 August 2012; in revised form: 10 September 2012 / Accepted: 17 September 2012 / Published: 27 September 2012
Show/Hide Abstract | Download PDF Full-text (3302 KB)
abstract graphic

Materials 2012, 5(5), 937-965; doi:10.3390/ma5050937
Received: 1 April 2012; in revised form: 11 May 2012 / Accepted: 16 May 2012 / Published: 24 May 2012
Show/Hide Abstract | Download PDF Full-text (2087 KB)

Materials 2011, 4(10), 1846-1860; doi:10.3390/ma4101846
Received: 21 September 2011; Accepted: 28 September 2011 / Published: 17 October 2011
Show/Hide Abstract | Download PDF Full-text (1083 KB)
abstract graphic

Last update: 27 February 2014

Materials EISSN 1996-1944 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert