## Journal Menu

► Journal Menu*Entropy* — Open Access Journal

*Entropy*(ISSN 1099-4300; CODEN: ENTRFG) is an international and interdisciplinary open access journal of entropy and information studies, published monthly online by MDPI.

- Open Access - free for readers, with article processing charges (APC) paid by authors or their institutions.
**High visibility:**indexed by the**Science Citation Index Expanded**(Web of Science),**MathSciNet (AMS)**,**Inspec (IET)**, Scopus and other databases.**Rapid publication:**manuscripts are peer-reviewed and a first decision provided to authors approximately 26 days after submission; acceptance to publication is undertaken in 4 days (median values for papers published in this journal in first half of 2017).**Testimonials:**See what our authors say about Entropy.

**Impact Factor:**
1.821 (2016)
; 5-Year Impact Factor:
1.947 (2016)

## Latest Articles

## Journal Contact

MDPI AG

St. Alban-Anlage 66, 4052 Basel, Switzerland

E-Mail:

Tel. +41 61 683 77 34

Fax: +41 61 302 89 18

Editorial Board

Contact Details Submit to

*Entropy*Editorial OfficeSt. Alban-Anlage 66, 4052 Basel, Switzerland

E-Mail:

^{}Tel. +41 61 683 77 34

Fax: +41 61 302 89 18

Editorial Board

Contact Details Submit to

*Entropy*Edit a special issue Review for*Entropy*## News

## Conferences

## Special Issues

Special Issue in
Entropy

Symbolic Entropy Analysis and Its Applications
Guest Editor: Raúl Alcaraz MartínezDeadline: 31 October 2017

Special Issue in
Entropy

Entropy in Signal Analysis
Guest Editors: Jose C. Principe, Badong ChenDeadline: 15 November 2017

Special Issue in
Entropy

Information Theory and 5G Technologies
Guest Editors: Luis Javier Garcia Villalba, Anura Jayasumana, Jun Bi, Ana Lucila Sandoval OrozcoDeadline: 30 November 2017

Special Issue in
Entropy

Entropy for Characterization of Uncertainty in Risk and Reliability
Guest Editors: Mohammad Modarres, Enrique López DroguettDeadline: 15 December 2017

## Topical Collections

Topical Collection in
Entropy

Entropy-Based Applied Cryptography and Enhanced Security for Future IT Environments
Collection Editor: James Park
Topical Collection in
Entropy

Advances in Applied Statistical Mechanics
Collection Editor: Antonio Scarfone