Development and Applications of Microwave/Millimeter Wave Diagnostics in Industry, 2nd Edition

Dear Colleagues,

Microwave/millimeter-wave diagnostics are widely employed in various industrial applications, as well as in remote sensing and plasma diagnostics, on account of two important features. Namely, the capacity to penetrate through dielectric materials, which can be applied to the nondestructive measurement of materials, and the fact transmissivity is not affected by the surrounding environment, another strong point of using radar and range meter technology. The low energy use compared to other wavelengths, such as X-rays, is appropriate for non-invasive biomedical measurements, as long as the probe beam power is sufficiently low to control the effect of heating. 

On the other hand, this technology suffers from poor spatial resolution due to its long wavelength. However, several research approaches have been undertaken to ameliorate this problem. Specifically, those approaches are the UWB (ultra-wide band) technique in the range direction and the SA (synthetic aperture) technique in the azimuth direction. The phase measurement of signal waves is also quite effective for achieving this objective. 

The ever-accelerating progress in microwave- and millimeter-wave devices and circuits, such as monolithic microwave integrated circuits (MMICs) and data processing, including computer technology, has contributed to the rapid advancement of diagnostic technology. This includes micro- to millimeter-wave imaging, including optics imaging, synthetic imaging, and MIMO (multi-input multi-output) imaging. These techniques are of critical importance in various applications due to the possibility of high localization and the accessibility of the measurements.

In this Special Issue, we will publish scientific papers related to industrial applications of micro- to millimeter-lenth waves, with topics including system development, data processing techniques, system application results, and physics-based understandings of results. However, we will also include many kinds of valuable studies that promote future advancements in this field.  

Prof. Dr. Atsushi Mase
Prof. Dr. Neville C. Luhmann
Guest Editors

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• microwave/millimeter-wave diagnostics
• industrial application
• non-destructive measurement
• biomedical measurement
• spatial resolution phase measurement
• imaging
• SAR
• MIMO
• automobile radar
• AI application