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Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179
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J. Low Power Electron. Appl. 2012, 2(4), 211-241; doi:10.3390/jlpea2040211
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article html file updated 24 January 2013 02:59 CET Original file -
article html file updated 7 February 2013 15:17 CET Update -
article html file updated 17 June 2015 02:35 CEST Update http://www.mdpi.com/2079-9268/2/4/211/html
J. Low Power Electron. Appl. EISSN 2079-9268 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
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