Patent Analysis for Technology Intelligence

Dear Colleagues,

Patent data is a critical resource to analyze historical technology development and anticipate the promising technological opportunities. In a big data era, an intelligent approach based on a large amount of technological data should be employed to support the decision-making process in technology planning and development. Technology intelligence can be defined as the capture and delivery of technological information as part of the process whereby an organization develops an awareness of technological threats and opportunities (Kerr et al., 2006). In addition, the concept can be extended into the intelligent problem solving in the activities of research and development (R&D). Although various data sources enable the technology intelligence, patent data is the most appropriate information in terms of data size and standardization level. Thus, many approaches of patent analysis, such as patent maps, patent networks and TRIZ are proposed to enhance a systematic process for technology development. This Special Issue aims to discuss the utilization of patent analysis in the invention of new technology. Both quantitative and qualitative approaches are possible for this subject because the combination of two types can provide high quality of results. In addition, academic, as well as practical articles are welcome for the publication because invention of new technology should be a problem in practical fields of technology development, and simultaneously based on well-organized methodologies. The Special Issue will include (but is not limited to) the following topics of interest:

• The use of patent data in solving technological problems
• Impacts of patent analysis in R&D management or technology development
• Forecasting technological opportunities based on patent analysis
• Technology intelligence systems for patent analysis
• Modelling a patent analysis methodology for technology development
• Visualization of patent information
• The application of text mining techniques for contents analysis of patent documents

Prof. Dr. Byungun Yoon
Prof. Dr. Sungjoo Lee
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Inventions is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1800 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• Patent analysis
• Technology intelligence
• Technology opportunity analysis
• Data visualization
• Technology forecasting
• Technological problem solving