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Journal: Electronics, 2016
Volume: 5
Number: 20

Article: Trapping Analysis of AlGaN/GaN Schottky Diodes via Current Transient Spectroscopy
Authors: by Martin Florovič, Jaroslava Škriniarová, Jaroslav Kováč and Peter Kordoš
Link: https://www.mdpi.com/2079-9292/5/2/20

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