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		<title>Electronics</title>
		<link>http://www.mdpi.com/journal/electronics</link>
		<description>Latest open access articles published in Electronics at http://www.mdpi.com/journal/electronics</description>
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	<title><![CDATA[Electronics, Vol. 2, Pages 178-191: Effects of Localized Trap-States and Corrugation on Charge Transport in Graphene Nanoribbons]]></title>
	<link>http://www.mdpi.com/2079-9292/2/2/178</link>
	<description>We investigate effects of the electron traps on adiabatic charge transport in graphene nanoribbons under a longitudinal surface acoustic wave (SAW) potential. Due to the weak SAW potential and strong transverse confinement of nanoribbons, minibands of sliding tunnel-coupled quantum dots are formed. Therefore, as the chemical potential passes through minigaps, quantized adiabatic charge transport is expected to occur. We analyze the condition for a closed minigap, thereby destroying the current quantization in a nanoribbon. We present numerical calculations showing the localized energy states within minigaps. Additionally, we compare the results with the minibands of corrugated nanoribbons.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2013-05-21</prism:publicationDate>
	<prism:volume>2</prism:volume>
	<prism:number>2</prism:number>
	<prism:section>Article</prism:section>
	<prism:doi>10.3390/electronics2020178</prism:doi>
	<prism:startingPage>178</prism:startingPage>
		<prism:endingPage>191</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Effects of Localized Trap-States and Corrugation on Charge Transport in Graphene Nanoribbons]]></dc:title>
    <dc:date>2013-05-21</dc:date>
	<dc:identifier>doi: 10.3390/electronics2020178</dc:identifier>
    	<dc:creator>Oleksiy Roslyak</dc:creator>
		<dc:creator>Upali Aparajita</dc:creator>
		<dc:creator>Godfrey Gumbs</dc:creator>
		<dc:creator>Danhong Huang</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/2/2/168">
	<title><![CDATA[Electronics, Vol. 2, Pages 168-177: Embroidered Coils for Magnetic Resonance Sensors]]></title>
	<link>http://www.mdpi.com/2079-9292/2/2/168</link>
	<description>Magnetic resonance imaging is a widely used technique for medical and materials imaging. Even though the objects being imaged are often irregularly shaped, suitable coils permitting the measurement of the radio-frequency signal in these systems are usually made of solid copper. One problem often encountered is how to ensure the coils are both in close proximity and conformal to the object being imaged. Whilst embroidered conductive threads have previously been used as antennae in mobile telecommunications applications, they have not previously been reported for use within magnetic resonance. In this paper we show that an embroidered single loop coil can be used in a commercial unilateral nuclear magnetic resonance system as an alternative to a solid copper. Data is presented showing the determination of both longitudinal (T1) and effective transverse (T2eff) relaxation times for a flat fabric coil and the same coil conformed to an 8 cm diameter cylinder. We thereby demonstrate the principles required for the wider use of fabric based conformal coils within nuclear magnetic resonance and magnetic  resonance imaging.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2013-04-18</prism:publicationDate>
	<prism:volume>2</prism:volume>
	<prism:number>2</prism:number>
	<prism:section>Article</prism:section>
	<prism:doi>10.3390/electronics2020168</prism:doi>
	<prism:startingPage>168</prism:startingPage>
		<prism:endingPage>177</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Embroidered Coils for Magnetic Resonance Sensors]]></dc:title>
    <dc:date>2013-04-18</dc:date>
	<dc:identifier>doi: 10.3390/electronics2020168</dc:identifier>
    	<dc:creator>Robert Morris</dc:creator>
		<dc:creator>Glen McHale</dc:creator>
		<dc:creator>Tilak Dias</dc:creator>
		<dc:creator>Michael Newton</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/2/2/113">
	<title><![CDATA[Electronics, Vol. 2, Pages 113-167: High-Feedback Operation of Power Electronic Converters]]></title>
	<link>http://www.mdpi.com/2079-9292/2/2/113</link>
	<description>The purpose of this review is to provide a survey of some of the most important bifurcation phenomena that one can observe in pulse-modulated converter systems when operating with high corrector gain factors. Like other systems with switching control, electronic converter systems belong to the class of piecewise-smooth dynamical systems. A characteristic feature of such systems is that the trajectory is “sewed” together from subsequent discrete parts. Moreover, the transitions between different modes of operation in response to a parameter variation are often qualitatively different from the bifurcations we know for smooth systems. The review starts with an introduction to the concept of border-collision bifurcations and also demonstrates the approach by which the full dynamics of the piecewise-linear, time-continuous system can be reduced to the dynamics of a piecewise-smooth map. We describe the main bifurcation structures that one observes in three different types of converter systems: (1) a DC/DC converter; (2) a multi-level DC/DC converter; and (3) a DC/AC converter. Our focus will be on the bifurcations by which the regular switching dynamics becomes unstable and is replaced by ergodic or resonant periodic dynamics on the surface of a two-dimensional torus. This transition occurs when the feedback gain is increased beyond a certain threshold, for instance in Electronics 2013, 2 114 order to improve the speed and accuracy of the output voltage regulation. For each of the three converter types, we discuss a number of additional bifurcation phenomena, including the formation and reconstruction of multi-layered tori and the appearance of phase-synchronized quasiperiodicity. Our numerical simulations are compared with experimentally observed waveforms.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2013-03-27</prism:publicationDate>
	<prism:volume>2</prism:volume>
	<prism:number>2</prism:number>
	<prism:section>Review</prism:section>
	<prism:doi>10.3390/electronics2020113</prism:doi>
	<prism:startingPage>113</prism:startingPage>
		<prism:endingPage>167</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[High-Feedback Operation of Power Electronic Converters]]></dc:title>
    <dc:date>2013-03-27</dc:date>
	<dc:identifier>doi: 10.3390/electronics2020113</dc:identifier>
    	<dc:creator>Zhanybai Zhusubaliyev</dc:creator>
		<dc:creator>Erik Mosekilde</dc:creator>
		<dc:creator>Alexey Andriyanov</dc:creator>
		<dc:creator>Gennady Mikhal&#039;chenko</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/2/1/94">
	<title><![CDATA[Electronics, Vol. 2, Pages 94-112: Analysis and Design of a Higher Current ZVS-PWM Converter for Industrial Applications]]></title>
	<link>http://www.mdpi.com/2079-9292/2/1/94</link>
	<description>A new auxiliary circuit that can be implemented in DC-DC and AC-DC  ZVS-PWM converters is proposed in the paper. The circuit is for ZVS-PWM converters used in applications where high-frequency operation is needed and the load current is higher than that of typical ZVS-PWM converters. In the paper, the operation of a new ZVS-PWM converter is described, its steady-state operation is analyzed, and a procedure for its design is derived and then demonstrated. The feasibility of the new converter is confirmed by experimental results obtained from a prototype.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2013-03-08</prism:publicationDate>
	<prism:volume>2</prism:volume>
	<prism:number>1</prism:number>
	<prism:section>Article</prism:section>
	<prism:doi>10.3390/electronics2010094</prism:doi>
	<prism:startingPage>94</prism:startingPage>
		<prism:endingPage>112</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Analysis and Design of a Higher Current ZVS-PWM Converter for Industrial Applications]]></dc:title>
    <dc:date>2013-03-08</dc:date>
	<dc:identifier>doi: 10.3390/electronics2010094</dc:identifier>
    	<dc:creator>Navid Golbon</dc:creator>
		<dc:creator>Gerry Moschopoulos</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/2/1/80">
	<title><![CDATA[Electronics, Vol. 2, Pages 80-93: Far Field Extrapolation from Near Field Interactions and Shielding Influence Investigations Based on a FE-PEEC Coupling Method]]></title>
	<link>http://www.mdpi.com/2079-9292/2/1/80</link>
	<description>Regarding standards, it is well established that common mode currents are the main source of far field emitted by variable frequency drive (VFD)-cable-motor associations. These currents are generated by the combination of floating potentials with stray capacitances between these floating potential tracks and the mechanical parts connected to the earth (the heatsink or cables are usual examples). Nowadays, due to frequency and power increases, the systematic compliance to EMC (ElectroMagnetic Compatibility) becomes increasingly difficult and costly for industrials. As a consequence, there is a well-identified need to investigate practical and low cost solutions to reduce the radiated fields of VFD-cable-motor associations. A well-adapted solution is the shielding of wound components well known as the major source of near magnetic field. However, this solution is not convenient, it is expensive and may not be efficient regarding far field reduction. Optimizing the components placement could be a better and cheaper solution. As a consequence, dedicated tools have to be developed to efficiently investigate not easy comprehendible phenomena and finally to control EMC disturbances using component placement, layout geometry, shielding design if needed. However, none of the modeling methods usually used in industry complies with large frequency range and far field models including magnetic materials, multilayer PCBs, and shielding. The contribution of this paper is to show that alternatives regarding modeling solutions exist and can be used to get in-deep analysis of such complex structures. It is shown in this paper that near field investigations can give information on far field behavior. It is illustrated by an investigation of near field interactions and shielding influence using a FE-PEEC hybrid method. The test case combining a common mode filter with the floating potentials tracks of an inverter is based on an industrial and commercialized VFD. The near field interactions between the common mode inductance and the tracks with floating potentials are revealed. Then, the influence of the common mode inductance shielding is analyzed.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2013-03-08</prism:publicationDate>
	<prism:volume>2</prism:volume>
	<prism:number>1</prism:number>
	<prism:section>Article</prism:section>
	<prism:doi>10.3390/electronics2010080</prism:doi>
	<prism:startingPage>80</prism:startingPage>
		<prism:endingPage>93</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Far Field Extrapolation from Near Field Interactions and Shielding Influence Investigations Based on a FE-PEEC Coupling Method]]></dc:title>
    <dc:date>2013-03-08</dc:date>
	<dc:identifier>doi: 10.3390/electronics2010080</dc:identifier>
    	<dc:creator>Edith Clavel</dc:creator>
		<dc:creator>Thanh-Son Tran</dc:creator>
		<dc:creator>Jérémie Aimé</dc:creator>
		<dc:creator>Gérard Meunier</dc:creator>
		<dc:creator>James Roudet</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/2/1/57">
	<title><![CDATA[Electronics, Vol. 2, Pages 57-79: Design of a Parallel Sampling Encoder for Analog to Information (A2I) Converters: Theory, Architecture and CMOS Implementation]]></title>
	<link>http://www.mdpi.com/2079-9292/2/1/57</link>
	<description>We discuss the architecture and design of parallel sampling front ends for analog to information (A2I) converters. As a way of example, we detail the design of a custom 0.5 µm CMOS implementation of a mixed signal parallel sampling encoder architecture. The system consists of configurable parallel analog processing channels, whose output is sampled by traditional analog-to-digital converters (ADCs). The analog front-end modulates the signal of interest with a high-speed digital chipping sequence and integrates the result prior to sampling at a low rate. An FPGA is employed to generate the chipping sequences and process the digitized samples.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2013-03-05</prism:publicationDate>
	<prism:volume>2</prism:volume>
	<prism:number>1</prism:number>
	<prism:section>Article</prism:section>
	<prism:doi>10.3390/electronics2010057</prism:doi>
	<prism:startingPage>57</prism:startingPage>
		<prism:endingPage>79</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Design of a Parallel Sampling Encoder for Analog to Information (A2I) Converters: Theory, Architecture and CMOS Implementation]]></dc:title>
    <dc:date>2013-03-05</dc:date>
	<dc:identifier>doi: 10.3390/electronics2010057</dc:identifier>
    	<dc:creator>Thomas Murray</dc:creator>
		<dc:creator>Philippe Pouliquen</dc:creator>
		<dc:creator>Andreas Andreou</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/2/1/41">
	<title><![CDATA[Electronics, Vol. 2, Pages 41-56: Fault Tree Analysis for Safety/Security Verification in  Aviation Software]]></title>
	<link>http://www.mdpi.com/2079-9292/2/1/41</link>
	<description>The Next Generation Air Traffic Management system (NextGen) is a blueprint of the future National Airspace System. Supporting NextGen is a nation-wide Aviation Simulation Network (ASN), which allows integration of a variety of real-time simulations to facilitate development and validation of the NextGen software by simulating a wide range of operational scenarios. The ASN system is an environment, including both simulated and human-in-the-loop real-life components (pilots and air traffic controllers). Real Time Distributed Simulation (RTDS) developed at Embry Riddle Aeronautical University, a suite of applications providing low and medium fidelity en-route simulation capabilities, is one of the simulations contributing to the ASN. To support the interconnectivity with the ASN, we designed and implemented a dedicated gateway acting as an intermediary, providing logic for two-way communication and transfer messages between RTDS and ASN and storage for the exchanged data. It has been necessary to develop and analyze safety/security requirements for the gateway software based on analysis of system assets, hazards, threats and attacks related to ultimate real-life future implementation. Due to the nature of the system, the focus was placed on communication security and the related safety of the impacted aircraft in the simulation scenario. To support development of safety/security requirements, a well-established fault tree analysis technique was used. This fault tree model-based analysis, supported by a commercial tool, was a foundation to propose mitigations assuring the gateway system safety and security.      </description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2013-01-31</prism:publicationDate>
	<prism:volume>2</prism:volume>
	<prism:number>1</prism:number>
	<prism:section>Technical Note</prism:section>
	<prism:doi>10.3390/electronics2010041</prism:doi>
	<prism:startingPage>41</prism:startingPage>
		<prism:endingPage>56</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Fault Tree Analysis for Safety/Security Verification in  Aviation Software]]></dc:title>
    <dc:date>2013-01-31</dc:date>
	<dc:identifier>doi: 10.3390/electronics2010041</dc:identifier>
    	<dc:creator>Andrew Kornecki</dc:creator>
		<dc:creator>Mingye Liu</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/2/1/35">
	<title><![CDATA[Electronics, Vol. 2, Pages 35-40: Handbook of RF, Microwave, and Millimeter-Wave Components. Edited by Leonid A. Belov, Sergey M. Smolskiy and Victor N. Kochemasov, Artech House, 2012; 504 pages.    Price: £119.00, ISBN 978-1-60807-209-5]]></title>
	<link>http://www.mdpi.com/2079-9292/2/1/35</link>
	<description>This unique and comprehensive resource offers you a detailed treatment of the operations principles, key parameters, and specific characteristics of active and passive RF, microwave, and millimeter-wave components. The book covers both linear and nonlinear components that are used in a wide range of application areas, from communications and information sciences, to avionics, space, and military engineering.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2013-01-14</prism:publicationDate>
	<prism:volume>2</prism:volume>
	<prism:number>1</prism:number>
	<prism:section>New Book Received</prism:section>
	<prism:doi>10.3390/electronics2010035</prism:doi>
	<prism:startingPage>35</prism:startingPage>
		<prism:endingPage>40</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Handbook of RF, Microwave, and Millimeter-Wave Components. Edited by Leonid A. Belov, Sergey M. Smolskiy and Victor N. Kochemasov, Artech House, 2012; 504 pages.    Price: £119.00, ISBN 978-1-60807-209-5]]></dc:title>
    <dc:date>2013-01-14</dc:date>
	<dc:identifier>doi: 10.3390/electronics2010035</dc:identifier>
    	<dc:creator>Shu-Kun Lin</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/2/1/1">
	<title><![CDATA[Electronics, Vol. 2, Pages 1-34: Implantable Devices: Issues and Challenges]]></title>
	<link>http://www.mdpi.com/2079-9292/2/1/1</link>
	<description>Ageing population and a multitude of neurological and cardiovascular illnesses that cannot be mitigated by medication alone have resulted in a significant growth in the number of patients that require implantable electronic devices. These range from sensors, gastric and cardiac pacemakers, cardioverter defibrillators, to deep brain, nerve, and bone stimulators. Long-term implants present specific engineering challenges, including low energy consumption and stable performance. Resorbable electronics may offer excellent short-term performance without the need for surgical removal. However, most electronic materials have poor bio- and cytocompatibility, resulting in immune reactions and infections. This paper reviews the current situation and highlights challenges for future advancements.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2012-12-21</prism:publicationDate>
	<prism:volume>2</prism:volume>
	<prism:number>1</prism:number>
	<prism:section>Review</prism:section>
	<prism:doi>10.3390/electronics2010001</prism:doi>
	<prism:startingPage>1</prism:startingPage>
		<prism:endingPage>34</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Implantable Devices: Issues and Challenges]]></dc:title>
    <dc:date>2012-12-21</dc:date>
	<dc:identifier>doi: 10.3390/electronics2010001</dc:identifier>
    	<dc:creator>Kateryna Bazaka</dc:creator>
		<dc:creator>Mohan Jacob</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/1/2/32">
	<title><![CDATA[Electronics, Vol. 1, Pages 32-46: Modified EAS Tag Used as a Resistive Sensor Platform]]></title>
	<link>http://www.mdpi.com/2079-9292/1/2/32</link>
	<description>In this article, a modified design of an RF Radio Frequency Electronic Article Surveillance (EAS) tag, used as a sensor platform, is manufactured and characterized. EAS tags are passive devices consisting of a capacitor and coil, tuned to a resonance frequency readable by the detector equipment, in this case 8.2 MHz. They were originally used to detect whether merchandise was being moved through the detection gates at shop exits, in which case an alarm was triggered. If the capacitance is divided in two and a resistive sensor device inserted in between, the resonant Inductor-Capacitor (LC) circuit becomes an Inductor-Capacitor-Capacitor-Resistor LCCR circuit and can be used as a sensor tag. A high sensor resistance means that one capacitor is decoupled, leading to one resonance frequency, while a low resistance will couple both capacitances into the circuit, resulting in a lower resonance frequency. Different types of resistive sensors exist that are able to detect properties such as pressure, moisture, light and temperature. The tag is manufactured in Aluminum foil on a polyetylentereftalat (PET) substrate, resulting in a cost effective RF-platform for various resistive sensors. Two types of tags are designed and manufactured, one with parallel plate capacitors and the other with interdigital capacitors. To test the tags, a resistive tilt sensor is mounted and the tags are characterized using a network analyzer. It is shown that for high resistance, the tags have a resonance frequency of morethan 10 MHz while for low values the frequency approaches 8.2 MHz.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2012-11-09</prism:publicationDate>
	<prism:volume>1</prism:volume>
	<prism:number>2</prism:number>
	<prism:section>Article</prism:section>
	<prism:doi>10.3390/electronics1020032</prism:doi>
	<prism:startingPage>32</prism:startingPage>
		<prism:endingPage>46</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Modified EAS Tag Used as a Resistive Sensor Platform]]></dc:title>
    <dc:date>2012-11-09</dc:date>
	<dc:identifier>doi: 10.3390/electronics1020032</dc:identifier>
    	<dc:creator>Henrik Andersson</dc:creator>
		<dc:creator>Krister Hammarling</dc:creator>
		<dc:creator>Johan Sidén</dc:creator>
		<dc:creator>Anatoliy Manuilskiy</dc:creator>
		<dc:creator>Thomas Öhlund</dc:creator>
		<dc:creator>Hans-Erik Nilsson</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/1/1/23">
	<title><![CDATA[Electronics, Vol. 1, Pages 23-31: Radiation Effects in Carbon Nanoelectronics]]></title>
	<link>http://www.mdpi.com/2079-9292/1/1/23</link>
	<description>We experimentally investigate the effects of Co-60 irradiation on the electrical properties of single-walled carbon nanotube and graphene field-effect transistors. We observe significant differences in the radiation response of devices depending on their irradiation environment, and confirm that, under controlled conditions, standard dielectric hardening approaches are applicable to carbon nanoelectronics devices.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2012-07-03</prism:publicationDate>
	<prism:volume>1</prism:volume>
	<prism:number>1</prism:number>
	<prism:section>Article</prism:section>
	<prism:doi>10.3390/electronics1010023</prism:doi>
	<prism:startingPage>23</prism:startingPage>
		<prism:endingPage>31</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Radiation Effects in Carbon Nanoelectronics]]></dc:title>
    <dc:date>2012-07-03</dc:date>
	<dc:identifier>doi: 10.3390/electronics1010023</dc:identifier>
    	<dc:creator>Cory D. Cress</dc:creator>
		<dc:creator>Julian J. McMorrow</dc:creator>
		<dc:creator>Jeremy T. Robinson</dc:creator>
		<dc:creator>Brian J. Landi</dc:creator>
		<dc:creator>Seth M. Hubbard</dc:creator>
		<dc:creator>Scott R. Messenger</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/1/1/3">
	<title><![CDATA[Electronics, Vol. 1, Pages 3-22: Multiple Bit Error Tolerant Galois Field Architectures Over GF (2m)]]></title>
	<link>http://www.mdpi.com/2079-9292/1/1/3</link>
	<description>Radiation induced transient faults like single event upsets (SEU) and multiple event upsets (MEU) in memories are well researched. As a result of the technology scaling, it is observed that the logic blocks are also vulnerable to malfunctioning when they are deployed in radiation prone environment. However, the current literature is lacking efforts to mitigate such issues in the digital logic circuits when exposed to natural radiation prone environment or when they are subjected to malicious attacks by an eavesdropper using highly energized particles. This may lead to catastrophe in critical applications such as widely used cryptographic hardware. In this paper, novel dynamic error correction architectures, based on the BCH codes, is proposed for correcting multiple errors which makes the circuits robust against radiation induced faults irrespective of the location of the errors. As a benchmark test case, the finite field multiplier circuit is considered as the functional block which can be the target for major attacks. The proposed scheme has the capability to handle stuck-at faults that are also a major cause of failure affecting the overall yield of a nano-CMOS integrated chip. The experimental results show that the proposed dynamic error detection and correction architecture results in 50% reduction in critical path delay by dynamically bypassing the error correction logic when no error is present. The area overhead for the larger multiplier is within 150% which is 33% lower than the TMR and comparable to 130% overhead of single error correcting Hamming and LDPC based techniques.</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2012-06-26</prism:publicationDate>
	<prism:volume>1</prism:volume>
	<prism:number>1</prism:number>
	<prism:section>Article</prism:section>
	<prism:doi>10.3390/electronics1010003</prism:doi>
	<prism:startingPage>3</prism:startingPage>
		<prism:endingPage>22</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Multiple Bit Error Tolerant Galois Field Architectures Over GF (2m)]]></dc:title>
    <dc:date>2012-06-26</dc:date>
	<dc:identifier>doi: 10.3390/electronics1010003</dc:identifier>
    	<dc:creator>Mahesh Poolakkaparambil</dc:creator>
		<dc:creator>Jimson Mathew</dc:creator>
		<dc:creator>Abusaleh Jabir</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
</item>
        <item rdf:about="http://www.mdpi.com/2079-9292/1/1/1">
	<title><![CDATA[Electronics, Vol. 1, Pages 1-2: Electronics — A New Multidisciplinary Open Access Journal]]></title>
	<link>http://www.mdpi.com/2079-9292/1/1/1</link>
	<description>The proliferation of electronic devices has profoundly affected all aspects of modern life. Large populations of people worldwide are now acclimated to the use of modern electronic devices on a daily basis. Giant industrial corporations, commercial companies and small businesses all use a variety of computing, communications and electronic devices to increase their productivity, enhance market research and improve customer support and satisfaction. [...].</description>

	<prism:publicationName>Electronics</prism:publicationName>
	<prism:publicationDate>2011-12-28</prism:publicationDate>
	<prism:volume>1</prism:volume>
	<prism:number>1</prism:number>
	<prism:section>Editorial</prism:section>
	<prism:doi>10.3390/electronics1010001</prism:doi>
	<prism:startingPage>1</prism:startingPage>
		<prism:endingPage>2</prism:endingPage>
		<prism:issn>2079-9292</prism:issn>
	
	<dc:title><![CDATA[Electronics — A New Multidisciplinary Open Access Journal]]></dc:title>
    <dc:date>2011-12-28</dc:date>
	<dc:identifier>doi: 10.3390/electronics1010001</dc:identifier>
    	<dc:creator>Mostafa Bassiouni</dc:creator>
	
	<cc:license rdf:resource="http://creativecommons.org/licenses/by/3.0/" />
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