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Journal: Electronics, 2015
Volume: 4
Number: 1090
Article:
Analysis of Deep Level Defects in GaN p-i-n Diodes after Beta Particle Irradiation
Authors:
by
Sofiane Belahsene, Noor Alhuda Al Saqri, Dler Jameel, Abdelmadjid Mesli, Anthony Martinez, Jacques De Sanoit, Abdallah Ougazzaden, Jean Paul Salvestrini, Abderrahim Ramdane and Mohamed Henini
Link:
https://www.mdpi.com/2079-9292/4/4/1090
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