Journal: Electronics, 2013
Article: Modeling Radiation-Induced Degradation in Top-Gated Epitaxial Graphene Field-Effect-Transistors (FETs)
Authors: Ivan S. Esqueda, Cory D. Cress, Travis J. Anderson, Jonathan R. Ahlbin, Michael Bajura, Michael Fritze and Jeong-S. Moon
MDPI provides reprints in high quality with convenient shipping to destinations worldwide. The articles are printed in on premium paper with high-resolution figures. Our covers are customized to your article and designed to be complimentary to the journal. These reprints are ideal additions to your portfolio. Copy details: 135g/m2 paper, 2x stitched, full colour and glossy finish, orderable in quantities from 10 to 1000.
If you have any questions, or special requests, please write to email@example.com; we are happy to provide you with the information you need.