Electronics 2013, 2(3), 234-245; doi:10.3390/electronics2030234
Article

Modeling Radiation-Induced Degradation in Top-Gated Epitaxial Graphene Field-Effect-Transistors (FETs)

1 Information Sciences Institute, University of Southern California, Arlington, VA 22203, USA 2 Naval Research Laboratory, Electronics Science and Technology Division, Washington, DC 20375, USA 3 HRL Laboratories LLC, Malibu, CA 90265, USA
* Author to whom correspondence should be addressed.
Received: 28 March 2013; in revised form: 30 June 2013 / Accepted: 10 July 2013 / Published: 24 July 2013
(This article belongs to the Special Issue Carbon Nanoelectronics)
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Abstract: This paper investigates total ionizing dose (TID) effects in top-gated epitaxial graphene field-effect-transistors (GFETs). Measurements reveal voltage shifts in the current-voltage (I-V) characteristics and degradation of carrier mobility and minimum conductivity, consistent with the buildup of oxide-trapped charges. A semi-empirical approach for modeling radiation-induced degradation in GFETs effective carrier mobility is described in the paper. The modeling approach describes Coulomb and short-range scattering based on calculations of charge and effective vertical field that incorporate radiation-induced oxide trapped charges. The transition from the dominant scattering mechanism is correctly described as a function of effective field and oxide trapped charge density. Comparison with experimental data results in good qualitative agreement when including an empirical component to account for scatterer transparency in the low field regime.
Keywords: graphene; field-effect-transistors (FETs); total ionizing dose (TID); radiation; conductivity; mobility

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MDPI and ACS Style

Esqueda, I.S.; Cress, C.D.; Anderson, T.J.; Ahlbin, J.R.; Bajura, M.; Fritze, M.; Moon, J.-S. Modeling Radiation-Induced Degradation in Top-Gated Epitaxial Graphene Field-Effect-Transistors (FETs). Electronics 2013, 2, 234-245.

AMA Style

Esqueda IS, Cress CD, Anderson TJ, Ahlbin JR, Bajura M, Fritze M, Moon J-S. Modeling Radiation-Induced Degradation in Top-Gated Epitaxial Graphene Field-Effect-Transistors (FETs). Electronics. 2013; 2(3):234-245.

Chicago/Turabian Style

Esqueda, Ivan S.; Cress, Cory D.; Anderson, Travis J.; Ahlbin, Jonathan R.; Bajura, Michael; Fritze, Michael; Moon, Jeong-S. 2013. "Modeling Radiation-Induced Degradation in Top-Gated Epitaxial Graphene Field-Effect-Transistors (FETs)." Electronics 2, no. 3: 234-245.

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