The Impact of Process Scaling on Scratchpad Memory Energy Savings†
AbstractScratchpad memories have been shown to reduce power consumption, but the different characteristics of nanometer scale processes, such as increased leakage power, motivate an examination of how the benefits of these memories change with process scaling. Process and application characteristics affect the amount of energy saved by a scratchpad memory. Increases in leakage as a percentage of total power particularly impact applications that rarely access memory. This study examines how the benefits of scratchpad memories have changed in newer processes, based on the measured performance of the WIMS (Wireless Integrated MicroSystems) microcontroller implemented in 180- and 65-nm processes and upon simulations of this microcontroller implemented in a 32-nm process. The results demonstrate that scratchpad memories will continue to improve the power dissipation of many applications, given the leakage anticipated in the foreseeable future. View Full-Text
Scifeed alert for new publicationsNever miss any articles matching your research from any publisher
- Get alerts for new papers matching your research
- Find out the new papers from selected authors
- Updated daily for 49'000+ journals and 6000+ publishers
- Define your Scifeed now
Redd, B.; Kellis, S.; Gaskin, N.; Brown, R. The Impact of Process Scaling on Scratchpad Memory Energy Savings. J. Low Power Electron. Appl. 2014, 4, 231-251.
Redd B, Kellis S, Gaskin N, Brown R. The Impact of Process Scaling on Scratchpad Memory Energy Savings. Journal of Low Power Electronics and Applications. 2014; 4(3):231-251.Chicago/Turabian Style
Redd, Bennion; Kellis, Spencer; Gaskin, Nathaniel; Brown, Richard. 2014. "The Impact of Process Scaling on Scratchpad Memory Energy Savings." J. Low Power Electron. Appl. 4, no. 3: 231-251.