Next Article in Journal
Next Article in Special Issue
Previous Article in Journal
Previous Article in Special Issue
Sensors 2009, 9(11), 8473-8489; doi:10.3390/s91108473
Article

A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors

*  and
Received: 6 August 2009; in revised form: 12 September 2009 / Accepted: 12 October 2009 / Published: 27 October 2009
View Full-Text   |   Download PDF [1085 KB, uploaded 21 June 2014]
Abstract: In this paper, we examine the effect of changing the temperature points on MEMS-based inertial sensor random error. We collect static data under different temperature points using a MEMS-based inertial sensor mounted inside a thermal chamber. Rigorous stochastic models, namely Autoregressive-based Gauss-Markov (AR-based GM) models are developed to describe the random error behaviour. The proposed AR-based GM model is initially applied to short stationary inertial data to develop the stochastic model parameters (correlation times). It is shown that the stochastic model parameters of a MEMS-based inertial unit, namely the ADIS16364, are temperature dependent. In addition, field kinematic test data collected at about 17 °C are used to test the performance of the stochastic models at different temperature points in the filtering stage using Unscented Kalman Filter (UKF). It is shown that the stochastic model developed at 20 °C provides a more accurate inertial navigation solution than the ones obtained from the stochastic models developed at −40 °C, −20 °C, 0 °C, +40 °C, and +60 °C. The temperature dependence of the stochastic model is significant and should be considered at all times to obtain optimal navigation solution for MEMS-based INS/GPS integration.
Keywords: MEMS; inertial sensor; temperature; AR model; GM model; UKF MEMS; inertial sensor; temperature; AR model; GM model; UKF
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Export to BibTeX |
EndNote


MDPI and ACS Style

El-Diasty, M.; Pagiatakis, S. A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors. Sensors 2009, 9, 8473-8489.

AMA Style

El-Diasty M, Pagiatakis S. A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors. Sensors. 2009; 9(11):8473-8489.

Chicago/Turabian Style

El-Diasty, Mohammed; Pagiatakis, Spiros. 2009. "A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors." Sensors 9, no. 11: 8473-8489.



Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert