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A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors
Department of Earth and Space Science and Engineering, York University, Toronto, ON M3J 1P3, Canada
* Author to whom correspondence should be addressed.
Received: 6 August 2009; in revised form: 12 September 2009 / Accepted: 12 October 2009 / Published: 27 October 2009
Abstract: In this paper, we examine the effect of changing the temperature points on MEMS-based inertial sensor random error. We collect static data under different temperature points using a MEMS-based inertial sensor mounted inside a thermal chamber. Rigorous stochastic models, namely Autoregressive-based Gauss-Markov (AR-based GM) models are developed to describe the random error behaviour. The proposed AR-based GM model is initially applied to short stationary inertial data to develop the stochastic model parameters (correlation times). It is shown that the stochastic model parameters of a MEMS-based inertial unit, namely the ADIS16364, are temperature dependent. In addition, field kinematic test data collected at about 17 °C are used to test the performance of the stochastic models at different temperature points in the filtering stage using Unscented Kalman Filter (UKF). It is shown that the stochastic model developed at 20 °C provides a more accurate inertial navigation solution than the ones obtained from the stochastic models developed at −40 °C, −20 °C, 0 °C, +40 °C, and +60 °C. The temperature dependence of the stochastic model is significant and should be considered at all times to obtain optimal navigation solution for MEMS-based INS/GPS integration.
Keywords: MEMS; inertial sensor; temperature; AR model; GM model; UKF
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Cite This Article
MDPI and ACS Style
El-Diasty, M.; Pagiatakis, S. A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors. Sensors 2009, 9, 8473-8489.
El-Diasty M, Pagiatakis S. A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors. Sensors. 2009; 9(11):8473-8489.
El-Diasty, Mohammed; Pagiatakis, Spiros. 2009. "A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors." Sensors 9, no. 11: 8473-8489.