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Coatings 2017, 7(9), 143; doi:10.3390/coatings7090143

A Comparative Study on the Elastic Characteristics of an Aluminum Thin-Film Using Laser Optical Measurement Techniques

1
School of Mechanical Engineering, Pusan National University, Busan 46241, Korea
2
Division of Mechanical, Automotive, and Robot Component Engineering, Dong-eui University, Busan 47340, Korea
*
Authors to whom correspondence should be addressed.
Received: 7 August 2017 / Revised: 25 August 2017 / Accepted: 7 September 2017 / Published: 10 September 2017
(This article belongs to the Special Issue Thin Film Deposition and Characterization Techniques)
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Abstract

The increase of a surface area-to-volume ratio with the reduction of material dimensions significantly alters the characteristics of materials from their macroscopic status. Therefore, efforts have been made to establish evaluation techniques for nanoscale films. While contact mechanics-based techniques are conventionally available, non-contact and nondestructive methods would be preferable in case damages left on a sample after testing are not desirable, or an in situ assessment is required. In the present study, the Young’s modulus of an aluminum thin-film was evaluated using two different laser optical measurement techniques. First, microscale beam testing has been performed so that the resonant frequency change of a microfabricated cantilever beam induced by coating of a 153 nm thick aluminum layer on its top surface can be detected using a laser interferometer in order to evaluate the mechanical property through modal analysis using the finite element method. Second, picosecond ultrasonics were employed for cross-verification so that the mechanical characteristics can be evaluated through the investigation of the longitudinal bulk wave propagation behavior. Results show that the Young’s moduli from both measurements agree well with each other within 3.3% error, proving that the proposed techniques are highly effective for the study of nanoscale films. View Full-Text
Keywords: thin-film; Young’s modulus; microscale beam testing; picosecond ultrasonics; laser metrology thin-film; Young’s modulus; microscale beam testing; picosecond ultrasonics; laser metrology
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Lee, S.; Kim, Y.Y.; Cho, Y. A Comparative Study on the Elastic Characteristics of an Aluminum Thin-Film Using Laser Optical Measurement Techniques. Coatings 2017, 7, 143.

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