Next Article in Journal
Tensile Strength of Silicon Nanowires Batch-Fabricated into Electrostatic MEMS Testing Device
Previous Article in Journal
A Tunable Mid-Infrared Solid-State Laser with a Compact Thermal Control System
Previous Article in Special Issue
Current Status of Single Particle Imaging with X-ray Lasers
Article Menu
Issue 6 (June) cover image

Export Article

Open AccessEditorial
Appl. Sci. 2018, 8(6), 879; https://doi.org/10.3390/app8060879

X-ray Free-Electron Laser

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
Received: 22 May 2018 / Revised: 24 May 2018 / Accepted: 24 May 2018 / Published: 28 May 2018
(This article belongs to the Special Issue X-Ray Free-Electron Laser)
View Full-Text   |   Download PDF [152 KB, uploaded 28 May 2018]
Note: In lieu of an abstract, this is an excerpt from the first page.

Excerpt

During the last decades, the advent of the short-wavelength Free Electron Lasers (FELs) in the range from extreme ultraviolet (XUV) to hard X-rays has opened a new research avenue for the investigations of ultrafast electronic and structural dynamics in any form of matter[...] View Full-Text
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).
SciFeed

Share & Cite This Article

MDPI and ACS Style

Ueda, K. X-ray Free-Electron Laser. Appl. Sci. 2018, 8, 879.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Appl. Sci. EISSN 2076-3417 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top