Next Article in Journal
A GTA Welding Cooling Rate Analysis on Stainless Steel and Aluminum Using Inverse Problems
Next Article in Special Issue
Optical Beam Deflection Based AFM with Integrated Hardware and Software Platform for an Undergraduate Engineering Laboratory
Previous Article in Journal
A Review of Experimental Techniques for Measuring Micro- to Nano-Particle-Laden Gas Flows
Previous Article in Special Issue
The Meaning and Measure of Vertical Resolution in Optical Surface Topography Measurement
Article Menu
Issue 2 (February) cover image

Export Article

Open AccessArticle
Appl. Sci. 2017, 7(2), 121; doi:10.3390/app7020121

The Model Analysis of a Complex Tuning Fork Probe and Its Application in Bimodal Atomic Force Microscopy

State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
*
Author to whom correspondence should be addressed.
Academic Editor: Richard Leach
Received: 20 November 2016 / Revised: 18 January 2017 / Accepted: 19 January 2017 / Published: 25 January 2017
(This article belongs to the Special Issue Dimensional Micro and Nanometrology)
View Full-Text   |   Download PDF [4805 KB, uploaded 25 January 2017]   |  

Abstract

A new electromechanical coupling model was built to quantitatively analyze the tuning fork probes, especially the complex ones. A special feature of a novel, soft tuning fork probe, that the second eigenfrequency of the probe was insensitive to the effective force gradient, was found and used in a homemade bimodal atomic force microscopy to measure power dissipation quantitatively. By transforming the mechanical parameters to the electrical parameters, a monotonous and concise method without using phase to calculate the power dissipation was proposed. View Full-Text
Keywords: tuning fork; bimodal AFM; electromechanical coupling model; power dissipation tuning fork; bimodal AFM; electromechanical coupling model; power dissipation
Figures

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

Scifeed alert for new publications

Never miss any articles matching your research from any publisher
  • Get alerts for new papers matching your research
  • Find out the new papers from selected authors
  • Updated daily for 49'000+ journals and 6000+ publishers
  • Define your Scifeed now

SciFeed Share & Cite This Article

MDPI and ACS Style

Wu, Z.; Guo, T.; Tao, R.; Xu, L.; Chen, J.; Fu, X.; Hu, X. The Model Analysis of a Complex Tuning Fork Probe and Its Application in Bimodal Atomic Force Microscopy. Appl. Sci. 2017, 7, 121.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Appl. Sci. EISSN 2076-3417 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top