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Appl. Sci. 2016, 6(9), 266; doi:10.3390/app6090266

Fault Localization Method by Partitioning Memory Using Memory Map and the Stack for Automotive ECU Software Testing

Department of Electrical and Computer Engineering, Ajou University, Suwon 16499, Korea
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Academic Editor: Antonio Maffucci
Received: 2 July 2016 / Revised: 9 September 2016 / Accepted: 9 September 2016 / Published: 19 September 2016
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Abstract

Recently, the usage of the automotive Electronic Control Unit (ECU) and its software in cars is increasing. Therefore, as the functional complexity of such software increases, so does the likelihood of software-related faults. Therefore, it is important to ensure the reliability of ECU software in order to ensure automobile safety. For this reason, systematic testing methods are required that can guarantee software quality. However, it is difficult to locate a fault during testing with the current ECU development system because a tester performs the black-box testing using a Hardware-in-the-Loop (HiL) simulator. Consequently, developers consume a large amount of money and time for debugging because they perform debugging without any information about the location of the fault. In this paper, we propose a method for localizing the fault utilizing memory information during black-box testing. This is likely to be of use to developers who debug automotive software. In order to observe whether symbols stored in the memory have been updated, the memory is partitioned by a memory map and the stack, thus the fault candidate region is reduced. A memory map method has the advantage of being able to finely partition the memory, and the stack method can partition the memory without a memory map. We validated these methods by applying these to HiL testing of the ECU for a body control system. The preliminary results indicate that a memory map and the stack reduce the possible fault locations to 22% and 19% of the updated memory, respectively. View Full-Text
Keywords: Electronic Control Unit (ECU); automotive software; fault localization; embedded testing; memory map; Hardware in the Loop (HiL); memory update Electronic Control Unit (ECU); automotive software; fault localization; embedded testing; memory map; Hardware in the Loop (HiL); memory update
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Kim, K.; Choi, K.-Y.; Lee, J.-W. Fault Localization Method by Partitioning Memory Using Memory Map and the Stack for Automotive ECU Software Testing. Appl. Sci. 2016, 6, 266.

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