Interactive Micromanipulation of Picking and Placement of Nonconductive Microsphere in Scanning Electron Microscope
AbstractIn this paper, classified theoretical models, consisting of contact with and placement of microsphere and picking operations, are simplified and established to depict the interactive behaviors of external and internal forces in pushing manipulations, respectively. Sliding and/or rolling cases, resulting in the acceleration of micromanipulations, are discussed in detail. Effective contact detection is achieved by combining alterations of light-shadow and relative movement displacement between the tip-sphere. Picking operations are investigated by typical interactive positions and different end tilt angles. Placements are realized by adjusting the proper end tilt angles. These were separately conducted to explore the interactive operations of nonconductive glass microspheres in a scanning electron microscope. The experimental results demonstrate that the proposed contact detection method can efficiently protect the end-tip from damage, regardless of operator skills in initial positioning operations. E-beam irradiation onto different interactive positions with end tilt angles can be utilized to pick up microspheres without bending the end-tip. In addition, the results of releasing deviations away from the pre-setting point were utilized to verify the effectiveness of the placement tilt angles. View Full-Text
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Cao, N.; Xie, S.; Wu, Z.; Liu, M.; Li, H.; Pu, H.; Luo, J.; Gong, Z. Interactive Micromanipulation of Picking and Placement of Nonconductive Microsphere in Scanning Electron Microscope. Micromachines 2017, 8, 257.
Cao N, Xie S, Wu Z, Liu M, Li H, Pu H, Luo J, Gong Z. Interactive Micromanipulation of Picking and Placement of Nonconductive Microsphere in Scanning Electron Microscope. Micromachines. 2017; 8(8):257.Chicago/Turabian Style
Cao, Ning; Xie, Shaorong; Wu, Zhizheng; Liu, Mei; Li, Hengyu; Pu, Huayan; Luo, Jun; Gong, Zhenbang. 2017. "Interactive Micromanipulation of Picking and Placement of Nonconductive Microsphere in Scanning Electron Microscope." Micromachines 8, no. 8: 257.
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