Surface Characterization of Polymer Blends by XPS and ToF-SIMS
AbstractThe surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends. View Full-Text
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Chan, C.M.; Weng, L.-T. Surface Characterization of Polymer Blends by XPS and ToF-SIMS. Materials 2016, 9, 655.
Chan CM, Weng L-T. Surface Characterization of Polymer Blends by XPS and ToF-SIMS. Materials. 2016; 9(8):655.Chicago/Turabian Style
Chan, Chi M.; Weng, Lu-Tao. 2016. "Surface Characterization of Polymer Blends by XPS and ToF-SIMS." Materials 9, no. 8: 655.
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