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Sensors 2009, 9(4), 3149-3160; doi:10.3390/s90403149
Article

Measurement Uncertainty Estimation of a Robust Photometer Circuit

1,*  and 2
1 Department of Circuits and Systems in the EUIT de Telecomunicación at the Universidad Politécnica de Madrid (UPM), Campus Sur UPM, Ctra. Valencia km 7, Madrid 28031, Spain 2 Department of Applied Physics in the ETSI Industriales at the Universidad Politécnica de Madrid, Calle José Gutierrez Abascal 2, Madrid 28006, Spain
* Author to whom correspondence should be addressed.
Received: 28 March 2009 / Revised: 22 April 2009 / Accepted: 24 April 2009 / Published: 24 April 2009
(This article belongs to the Section Physical Sensors)
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Abstract

In this paper the uncertainty of a robust photometer circuit (RPC) was estimated. Here, the RPC was considered as a measurement system, having input quantities that were inexactly known, and output quantities that consequently were also inexactly known. Input quantities represent information obtained from calibration certificates, specifications of manufacturers, and tabulated data. Output quantities describe the transfer function of the electrical part of the photodiode. Input quantities were the electronic components of the RPC, the parameters of the model of the photodiode and its sensitivity at 670 nm. The output quantities were the coefficients of both numerator and denominator of the closed-loop transfer function of the RPC. As an example, the gain and phase shift of the RPC versus frequency was evaluated from the transfer function, with their uncertainties and correlation coefficient. Results confirm the robustness of photodiode design.
Keywords: Photometer circuit; closed-loop transfer function; input quantity; uncertainty Photometer circuit; closed-loop transfer function; input quantity; uncertainty
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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MDPI and ACS Style

Hernandez, W.; De Vicente, J. Measurement Uncertainty Estimation of a Robust Photometer Circuit. Sensors 2009, 9, 3149-3160.

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