Next Article in Journal
Aptamer-Functionalized Nano-Biosensors
Next Article in Special Issue
Improving the Response of Accelerometers for Automotive Applications by Using LMS Adaptive Filters
Previous Article in Journal
Field Measurements and Guidelines for the Application of Wireless Sensor Networks to the Environment and Security
Previous Article in Special Issue
Registration Combining Wide and Narrow Baseline Feature Tracking Techniques for Markerless AR Systems
Sensors 2009, 9(12), 10341-10355; doi:10.3390/s91210341
Article

Algorithmic Error Correction of Impedance Measuring Sensors

1,* , 1
, 2
, 3
 and 4
Received: 3 November 2009; in revised form: 14 December 2009 / Accepted: 16 December 2009 / Published: 21 December 2009
View Full-Text   |   Download PDF [896 KB, uploaded 21 June 2014]   |   Browse Figures
Abstract: This paper describes novel design concepts and some advanced techniques proposed for increasing the accuracy of low cost impedance measuring devices without reduction of operational speed. The proposed structural method for algorithmic error correction and iterating correction method provide linearization of transfer functions of the measuring sensor and signal conditioning converter, which contribute the principal additive and relative measurement errors. Some measuring systems have been implemented in order to estimate in practice the performance of the proposed methods. Particularly, a measuring system for analysis of C-V, G-V characteristics has been designed and constructed. It has been tested during technological process control of charge-coupled device CCD manufacturing. The obtained results are discussed in order to define a reasonable range of applied methods, their utility, and performance.
Keywords: impedance measuring sensor; error correction; C-V; G-V characteristic meter impedance measuring sensor; error correction; C-V; G-V characteristic meter
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Export to BibTeX |
EndNote


MDPI and ACS Style

Starostenko, O.; Alarcon-Aquino, V.; Hernandez, W.; Sergiyenko, O.; Tyrsa, V. Algorithmic Error Correction of Impedance Measuring Sensors. Sensors 2009, 9, 10341-10355.

AMA Style

Starostenko O, Alarcon-Aquino V, Hernandez W, Sergiyenko O, Tyrsa V. Algorithmic Error Correction of Impedance Measuring Sensors. Sensors. 2009; 9(12):10341-10355.

Chicago/Turabian Style

Starostenko, Oleg; Alarcon-Aquino, Vicente; Hernandez, Wilmar; Sergiyenko, Oleg; Tyrsa, Vira. 2009. "Algorithmic Error Correction of Impedance Measuring Sensors." Sensors 9, no. 12: 10341-10355.


Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert