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Sensors 2009, 9(12), 10341-10355; doi:10.3390/s91210341
Article

Algorithmic Error Correction of Impedance Measuring Sensors

1,* , 1
, 2
, 3
 and 4
1 Research Center CENTIA, Department of Computing, Electronics and Mechatronics, Universidad de las Américas, Puebla, 72820, México 2 Department of Circuits and Systems in the EUIT de Telecomunicación, Universidad Politécnica de Madrid, Campus Sur UPM, Ctra. Valencia km 7, 28031, Madrid, Spain 3 Engineering Institute, Autonomous University of Baja California, Blvd. Benito Juárez y Calle de la Normal S/N, col. Insurgentes Este, 21280, Mexicali, Baja California, México 4 Universidad Politécnica de Baja California, Calle de la Claridad S/N, Col Plutarco Elías Calles, 21376, Mexicali, Baja California, México
* Author to whom correspondence should be addressed.
Received: 3 November 2009 / Revised: 14 December 2009 / Accepted: 16 December 2009 / Published: 21 December 2009
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Abstract

This paper describes novel design concepts and some advanced techniques proposed for increasing the accuracy of low cost impedance measuring devices without reduction of operational speed. The proposed structural method for algorithmic error correction and iterating correction method provide linearization of transfer functions of the measuring sensor and signal conditioning converter, which contribute the principal additive and relative measurement errors. Some measuring systems have been implemented in order to estimate in practice the performance of the proposed methods. Particularly, a measuring system for analysis of C-V, G-V characteristics has been designed and constructed. It has been tested during technological process control of charge-coupled device CCD manufacturing. The obtained results are discussed in order to define a reasonable range of applied methods, their utility, and performance.
Keywords: impedance measuring sensor; error correction; C-V; G-V characteristic meter impedance measuring sensor; error correction; C-V; G-V characteristic meter
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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MDPI and ACS Style

Starostenko, O.; Alarcon-Aquino, V.; Hernandez, W.; Sergiyenko, O.; Tyrsa, V. Algorithmic Error Correction of Impedance Measuring Sensors. Sensors 2009, 9, 10341-10355.

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