Abstract: We review the application of cantilever-based stress measurements in surface science and magnetism. The application of thin (thickness appr. 0.1 mm) single crystalline substrates as cantilevers has been used successfully to measure adsorbate-induced surface stress changes, lattice misfit induced film stress, and magneto-elastic stress of ferromagnetic monolayers. Surface stress changes as small as 0.01 N/m can be readily measured, and this translates into a sensitivity for adsorbate-coverage well below 0.01 of one layer. Stress as large as several GPa, beyond the elasticity limits of high strength materials, is measured, and it is ascribed to the lattice misfit between film and substrate. Our results point at the intimate relation between surface stress and surface reconstruction, stress-induced structural changes in epitaxially strained films, and strain-induced modifications of the magneto-elastic coupling in ferromagnetic monolayers.
Keywords: cantilever stress measurement; surface stress; surface reconstruction; film stress; magnetoelastic stress; torque magnetometry.
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Sander, D.; Tian, Z.; Kirschner, J. Cantilever measurements of surface stress, surface reconstruction, film stress and magnetoelastic stress of monolayers. Sensors 2008, 8, 4466-4486.
Sander D, Tian Z, Kirschner J. Cantilever measurements of surface stress, surface reconstruction, film stress and magnetoelastic stress of monolayers. Sensors. 2008; 8(7):4466-4486.
Sander, Dirk; Tian, Zhen; Kirschner, Jürgen. 2008. "Cantilever measurements of surface stress, surface reconstruction, film stress and magnetoelastic stress of monolayers." Sensors 8, no. 7: 4466-4486.