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Sensors 2008, 8(5), 3345-3354; doi:10.3390/s8053345
Communication

Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating

1
, 2
, 2
 and 1,*
Received: 14 May 2008; Accepted: 21 May 2008 / Published: 23 May 2008
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Abstract: Infrared temperature sensors, simple device for temperature measurement, have been modified for the measurement of temperature distribution on the metal surface in a way of nondestructive detection of defects of the object. In this study, the IR sensor system is utilized for the defect detection in a cylinder with one point heating, and the performance of the system is examined with an aluminum cylinder having a simulated defect. In addition, a 3-D conduction equation is numerically solved to compare the computed temperature profile with the measured one. The experimental outcome indicates that the defect detection is readily available with the proposed device and the point heating is practical for the applications of the defect detection. It is also found that the measured temperature distribution is comparable to the computed result from the conduction equation.
Keywords: Thermography; IR thermometer; Defect Detection; Nondestructive Detection Thermography; IR thermometer; Defect Detection; Nondestructive Detection
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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MDPI and ACS Style

Kim, B.C.; Heo, Y.G.; Suh, Y.K.; Kim, Y.H. Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating. Sensors 2008, 8, 3345-3354.

AMA Style

Kim BC, Heo YG, Suh YK, Kim YH. Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating. Sensors. 2008; 8(5):3345-3354.

Chicago/Turabian Style

Kim, Byoung C.; Heo, Young G.; Suh, Yong K.; Kim, Young H. 2008. "Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating." Sensors 8, no. 5: 3345-3354.


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