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Sensors 2008, 8(5), 3345-3354; doi:10.3390/s8053345
Communication
Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating
1
Department of Chemical Engineering, Dong-A University, 840 Hadan-dong, Saha-gu, Pusan, 604-714 Korea
2
Department of Mechanical Engineering, Dong-A University, 840 Hadan-dong, Saha-gu, Pusan, 604-714 Korea
* Author to whom correspondence should be addressed.
Received: 14 May 2008 / Accepted: 21 May 2008 / Published: 23 May 2008
Abstract: Infrared temperature sensors, simple device for temperature measurement, have been modified for the measurement of temperature distribution on the metal surface in a way of nondestructive detection of defects of the object. In this study, the IR sensor system is utilized for the defect detection in a cylinder with one point heating, and the performance of the system is examined with an aluminum cylinder having a simulated defect. In addition, a 3-D conduction equation is numerically solved to compare the computed temperature profile with the measured one. The experimental outcome indicates that the defect detection is readily available with the proposed device and the point heating is practical for the applications of the defect detection. It is also found that the measured temperature distribution is comparable to the computed result from the conduction equation.
Keywords: Thermography; IR thermometer; Defect Detection; Nondestructive Detection
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MDPI and ACS Style
Kim, B.C.; Heo, Y.G.; Suh, Y.K.; Kim, Y.H. Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating. Sensors 2008, 8, 3345-3354.
AMA StyleKim B.C., Heo Y.G., Suh Y.K., Kim Y.H. Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating. Sensors. 2008; 8(5):3345-3354.
Chicago/Turabian StyleKim, Byoung C.; Heo, Young G.; Suh, Yong K.; Kim, Young H. 2008. "Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating." Sensors 8, no. 5: 3345-3354.
Sensors
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