Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating
AbstractInfrared temperature sensors, simple device for temperature measurement, have been modified for the measurement of temperature distribution on the metal surface in a way of nondestructive detection of defects of the object. In this study, the IR sensor system is utilized for the defect detection in a cylinder with one point heating, and the performance of the system is examined with an aluminum cylinder having a simulated defect. In addition, a 3-D conduction equation is numerically solved to compare the computed temperature profile with the measured one. The experimental outcome indicates that the defect detection is readily available with the proposed device and the point heating is practical for the applications of the defect detection. It is also found that the measured temperature distribution is comparable to the computed result from the conduction equation.
Scifeed alert for new publicationsNever miss any articles matching your research from any publisher
- Get alerts for new papers matching your research
- Find out the new papers from selected authors
- Updated daily for 49'000+ journals and 6000+ publishers
- Define your Scifeed now
Kim, B.C.; Heo, Y.G.; Suh, Y.K.; Kim, Y.H. Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating. Sensors 2008, 8, 3345-3354.
Kim BC, Heo YG, Suh YK, Kim YH. Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating. Sensors. 2008; 8(5):3345-3354.Chicago/Turabian Style
Kim, Byoung C.; Heo, Young G.; Suh, Yong K.; Kim, Young H. 2008. "Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating." Sensors 8, no. 5: 3345-3354.