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Journal: Sensors, 2008
Volume: 8
Page(s): 3345-3354
3345-3354
Article: Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating
Kim, B.C.; Heo, Y.G.; Suh, Y.K.; Kim, Y.H.

http://www.mdpi.com/1424-8220/8/5/3345

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