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Journal: Sensors, 2008
Volume: 8
Page(s): 800-816
800-816
Article: An Automatic Instrument to Study the Spatial Scaling Behavior of Emissivity
Tian, J.; Zhang, R.; Su, H.; Sun, X.; Chen, S.; Xia, J.

http://www.mdpi.com/1424-8220/8/2/800

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