Sensors 2008, 8(2), 800-816; doi:10.3390/s8020800
Article

An Automatic Instrument to Study the Spatial Scaling Behavior of Emissivity

1 Key Laboratory of Water Cycle and Related Land Surface Processes, Institute of Geographical Sciences and Natural Resources Research, Chinese Academy of Sciences, Beijing, 100101, China 2 Synthesis Center of Chinese Ecosystem Research Network, Institute of Geographical Sciences and Natural Resources Research, Chinese Academy of Sciences, Beijing, 100101, China
* Author to whom correspondence should be addressed.
Received: 30 December 2007; Accepted: 30 January 2008 / Published: 8 January 2008
PDF Full-text Download PDF Full-Text [1898 KB, uploaded 16 September 2008 11:01 CEST]
Abstract: In this paper, the design of an automatic instrument for measuring the spatialdistribution of land surface emissivity is presented, which makes the direct in situmeasurement of the spatial distribution of emissivity possible. The significance of this newinstrument lies in two aspects. One is that it helps to investigate the spatial scalingbehavior of emissivity and temperature; the other is that, the design of the instrumentprovides theoretical and practical foundations for the implement of measuring distributionof surface emissivity on airborne or spaceborne. To improve the accuracy of themeasurements, the emissivity measurement and its uncertainty are examined in a series ofcarefully designed experiments. The impact of the variation of target temperature and theenvironmental irradiance on the measurement of emissivity is analyzed as well. Inaddition, the ideal temperature difference between hot environment and cool environmentis obtained based on numerical simulations. Finally, the scaling behavior of surfaceemissivity caused by the heterogeneity of target is discussed.
Keywords: surface emissivity; scaling; instrument; remote sensing

Article Statistics

Load and display the download statistics.

Citations to this Article

Cite This Article

MDPI and ACS Style

Tian, J.; Zhang, R.; Su, H.; Sun, X.; Chen, S.; Xia, J. An Automatic Instrument to Study the Spatial Scaling Behavior of Emissivity. Sensors 2008, 8, 800-816.

AMA Style

Tian J, Zhang R, Su H, Sun X, Chen S, Xia J. An Automatic Instrument to Study the Spatial Scaling Behavior of Emissivity. Sensors. 2008; 8(2):800-816.

Chicago/Turabian Style

Tian, Jing; Zhang, Renhua; Su, Hongbo; Sun, Xiaomin; Chen, Shaohui; Xia, Jun. 2008. "An Automatic Instrument to Study the Spatial Scaling Behavior of Emissivity." Sensors 8, no. 2: 800-816.

Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert