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Journal: Sensors, 2007
Volume: 7
Page(s): 2846-2859
2846-2859
Article: Quantitative Accelerated Life Testing of MEMS Accelerometers
Bâzu, M.; Gălăţeanu, L.; Ilian, V.E.; Loicq, J.; Habraken, S.; Collette, J.-P.

http://www.mdpi.com/1424-8220/7/11/2846

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