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Journal: Sensors, 2006
Volume: 6
Page(s): 397-404

Article: Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell
Poghossian, A.; Schumacher, K.; Kloock, J.P.; Rosenkranz, C.; Schultze, J.W.; Müller-Veggian, M.; Schöning, M.J.

http://www.mdpi.com/1424-8220/6/4/397

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