Next Article in Journal
The Development of the Differential MEMS Vector Hydrophone
Next Article in Special Issue
III–V-on-Silicon Photonic Integrated Circuits for Spectroscopic Sensing in the 2–4 μm Wavelength Range
Previous Article in Journal
An FPGA-Based WASN for Remote Real-Time Monitoring of Endangered Species: A Case Study on the Birdsong Recognition of Botaurus stellaris
Previous Article in Special Issue
Parallel Detection of Refractive Index Changes in a Porous Silicon Microarray Based on Digital Images
Article Menu
Issue 6 (June) cover image

Export Article

Open AccessArticle
Sensors 2017, 17(6), 1335; doi:10.3390/s17061335

Image Processing of Porous Silicon Microarray in Refractive Index Change Detection

1
College of Information Science and Engineering, Xinjiang University, Urumqi 830046, China
2
Institute of Image Processing and Pattern Recognition, Shanghai Jiao Tong University, Shanghai 200240, China
3
Knowledge Engineering and Discovery Research Institute, Auckland University of Technology, Auckland 1020, New Zealand
4
School of Physical Science and Technology, Xinjiang University, Urumqi 830046, China
*
Author to whom correspondence should be addressed.
Received: 4 May 2017 / Revised: 6 June 2017 / Accepted: 6 June 2017 / Published: 8 June 2017
(This article belongs to the Special Issue Silicon Technologies for Photonic Sensors)
View Full-Text   |   Download PDF [5439 KB, uploaded 9 June 2017]   |  

Abstract

A new method for extracting the dots is proposed by the reflected light image of porous silicon (PSi) microarray utilization in this paper. The method consists of three parts: pretreatment, tilt correction and spot segmentation. First, based on the characteristics of different components in HSV (Hue, Saturation, Value) space, a special pretreatment is proposed for the reflected light image to obtain the contour edges of the array cells in the image. Second, through the geometric relationship of the target object between the initial external rectangle and the minimum bounding rectangle (MBR), a new tilt correction algorithm based on the MBR is proposed to adjust the image. Third, based on the specific requirements of the reflected light image segmentation, the array cells are segmented into dots as large as possible and the distance between the dots is equal in the corrected image. Experimental results show that the pretreatment part of this method can effectively avoid the influence of complex background and complete the binarization processing of the image. The tilt correction algorithm has a shorter computation time, which makes it highly suitable for tilt correction of reflected light images. The segmentation algorithm makes the dots in a regular arrangement, excludes the edges and the bright spots. This method could be utilized in the fast, accurate and automatic dots extraction of the PSi microarray reflected light image. View Full-Text
Keywords: porous silicon microarray; feflected light image; pretreatment; tilt correction; spot segmentation porous silicon microarray; feflected light image; pretreatment; tilt correction; spot segmentation
Figures

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

Scifeed alert for new publications

Never miss any articles matching your research from any publisher
  • Get alerts for new papers matching your research
  • Find out the new papers from selected authors
  • Updated daily for 49'000+ journals and 6000+ publishers
  • Define your Scifeed now

SciFeed Share & Cite This Article

MDPI and ACS Style

Guo, Z.; Jia, Z.; Yang, J.; Kasabov, N.; Li, C. Image Processing of Porous Silicon Microarray in Refractive Index Change Detection. Sensors 2017, 17, 1335.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top