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Sensors 2016, 16(10), 1572; doi:10.3390/s16101572

A Low Power Digital Accumulation Technique for Digital-Domain CMOS TDI Image Sensor

School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai District, Tianjin 300072, China
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Academic Editor: Gonzalo Pajares Martinsanz
Received: 13 July 2016 / Revised: 18 September 2016 / Accepted: 19 September 2016 / Published: 23 September 2016
(This article belongs to the Special Issue Imaging: Sensors and Technologies)
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Abstract

In this paper, an accumulation technique suitable for digital domain CMOS time delay integration (TDI) image sensors is proposed to reduce power consumption without degrading the rate of imaging. In terms of the slight variations of quantization codes among different pixel exposures towards the same object, the pixel array is divided into two groups: one is for coarse quantization of high bits only, and the other one is for fine quantization of low bits. Then, the complete quantization codes are composed of both results from the coarse-and-fine quantization. The equivalent operation comparably reduces the total required bit numbers of the quantization. In the 0.18 µm CMOS process, two versions of 16-stage digital domain CMOS TDI image sensor chains based on a 10-bit successive approximate register (SAR) analog-to-digital converter (ADC), with and without the proposed technique, are designed. The simulation results show that the average power consumption of slices of the two versions are 6 . 47 × 10 - 8 J/line and 7 . 4 × 10 - 8 J/line, respectively. Meanwhile, the linearity of the two versions are 99.74% and 99.99%, respectively. View Full-Text
Keywords: CMOS TDI image sensor; accumulation technique; coarse quantization; fine quantization CMOS TDI image sensor; accumulation technique; coarse quantization; fine quantization
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Yu, C.; Nie, K.; Xu, J.; Gao, J. A Low Power Digital Accumulation Technique for Digital-Domain CMOS TDI Image Sensor. Sensors 2016, 16, 1572.

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