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Sensors 2015, 15(3), 4796-4809; doi:10.3390/s150304796

Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing

1
Nanoscience Laboratory, Dept. Physics, University of Trento, Via Sommarive 14, I-38123 Trento, Italy
2
Center for Materials and Microsystems, Fondazione Bruno Kessler, via Sommarive 18,I-38123 Trento, Italy
*
Author to whom correspondence should be addressed.
Academic Editor: M. Selim Ünlü
Received: 11 January 2015 / Revised: 10 February 2015 / Accepted: 13 February 2015 / Published: 26 February 2015
(This article belongs to the Special Issue Advances in Optical Biosensors)
View Full-Text   |   Download PDF [1814 KB, uploaded 26 February 2015]   |  

Abstract

In this paper, we report on the measurement and modeling of enhanced optical refractometric sensors based on whispering gallery modes. The devices under test are optical microresonators made of silicon nitride on silicon oxide, which differ in their sidewall inclination angle. In our approach, these microresonators are vertically coupled to a buried waveguide with the aim of creating integrated and cost-effective devices. Device modeling shows that the optimization of the device is a delicate balance of the resonance quality factor and evanescent field overlap with the surrounding environment to analyze. By numerical simulations, we show that the microdisk thickness is critical to yield a high figure of merit for the sensor and that edge inclination should be kept as high as possible. We also show that bulk-sensing figures of merit as high as 1600 RIU-1 (refractive index unit) are feasible. View Full-Text
Keywords: whispering gallery mode; optical resonators; wedge resonator; optical sensing; refractometric sensing; biological sensing; limit of detection; figure of merit whispering gallery mode; optical resonators; wedge resonator; optical sensing; refractometric sensing; biological sensing; limit of detection; figure of merit
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Gandolfi, D.; Ramiro-Manzano, F.; Aparicio Rebollo, F.J.; Ghulinyan, M.; Pucker, G.; Pavesi, L. Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing. Sensors 2015, 15, 4796-4809.

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