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Sensors 2014, 14(11), 21941-21949; doi:10.3390/s141121941

The Coefficient of the Voltage Induced Frequency Shift Measurement on a Quartz Tuning Fork

1
and
1,2,*
1
High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031, China
2
Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, China
*
Author to whom correspondence should be addressed.
Received: 10 September 2014 / Revised: 22 October 2014 / Accepted: 12 November 2014 / Published: 19 November 2014
(This article belongs to the Section Physical Sensors)
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Abstract

We have measured the coefficient of the voltage induced frequency shift (VIFS) of a 32.768 KHz quartz tuning fork. Three vibration modes were studied: one prong oscillating, two prongs oscillating in the same direction, and two prongs oscillating in opposite directions. They all showed a parabolic dependence of the eigen-frequency shift on the bias voltage applied across the fork, due to the voltage-induced internal stress, which varies as the fork oscillates. The average coefficient of the VIFS effect is as low as several hundred nano-Hz per millivolt, implying that fast-response voltage-controlled oscillators and phase-locked loops with nano-Hz resolution can be built. View Full-Text
Keywords: qplus; quartz tuning fork; piezoelectric frequency effect; eigen-frequency shift; voltage induced frequency shift qplus; quartz tuning fork; piezoelectric frequency effect; eigen-frequency shift; voltage induced frequency shift
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Hou, Y.; Lu, Q. The Coefficient of the Voltage Induced Frequency Shift Measurement on a Quartz Tuning Fork. Sensors 2014, 14, 21941-21949.

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