Next Article in Journal
Detection of Interference Phase by Digital Computation of Quadrature Signals in Homodyne Laser Interferometry
Previous Article in Journal
FPGA-Based Multiprocessor System for Injection Molding Control
Article Menu

Export Article

Open AccessArticle
Sensors 2012, 12(10), 14084-14094; doi:10.3390/s121014084

Refractive Index Compensation in Over-Determined Interferometric Systems

Institute of Scientific Instruments, Academy of Sciences of the Czech Republic, Královopolská 147, 612 64 Brno, Czech Republic
*
Author to whom correspondence should be addressed.
Received: 4 September 2012 / Revised: 11 October 2012 / Accepted: 12 October 2012 / Published: 19 October 2012
(This article belongs to the Section Physical Sensors)
View Full-Text   |   Download PDF [966 KB, uploaded 21 June 2014]   |  

Abstract

We present an interferometric technique based on a differential interferometry setup for measurement under atmospheric conditions. The key limiting factor in any interferometric dimensional measurement are fluctuations of the refractive index of air representing a dominating source of uncertainty when evaluated indirectly from the physical parameters of the atmosphere. Our proposal is based on the concept of an over-determined interferometric setup where a reference length is derived from a mechanical frame made from a material with a very low thermal coefficient. The technique allows one to track the variations of the refractive index of air on-line directly in the line of the measuring beam and to compensate for the fluctuations. The optical setup consists of three interferometers sharing the same beam path where two measure differentially the displacement while the third evaluates the changes in the measuring range, acting as a tracking refractometer. The principle is demonstrated in an experimental setup. View Full-Text
Keywords: refractometry; nanopositioning; interferometry; nanometrology refractometry; nanopositioning; interferometry; nanometrology
This is an open access article distributed under the Creative Commons Attribution License (CC BY 3.0).

Scifeed alert for new publications

Never miss any articles matching your research from any publisher
  • Get alerts for new papers matching your research
  • Find out the new papers from selected authors
  • Updated daily for 49'000+ journals and 6000+ publishers
  • Define your Scifeed now

SciFeed Share & Cite This Article

MDPI and ACS Style

Lazar, J.; Holá, M.; Číp, O.; Čížek, M.; Hrabina, J.; Buchta, Z. Refractive Index Compensation in Over-Determined Interferometric Systems. Sensors 2012, 12, 14084-14094.

Show more citation formats Show less citations formats

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top