Sensors 2012, 12(1), 175-188; doi:10.3390/s120100175
Article

Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry

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Received: 23 November 2011; in revised form: 20 December 2011 / Accepted: 21 December 2011 / Published: 27 December 2011
(This article belongs to the Section Physical Sensors)
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract: A hybrid atomic force microscopic (AFM) measurement system combined with white light scanning interferometry for micro/nanometer dimensional measurement is developed. The system is based on a high precision large-range positioning platform with nanometer accuracy on which a white light scanning interferometric module and an AFM head are built. A compact AFM head is developed using a self-sensing tuning fork probe. The head need no external optical sensors to detect the deflection of the cantilever, which saves room on the head, and it can be directly fixed under an optical microscopic interferometric system. To enhance the system’s dynamic response, the frequency modulation (FM) mode is adopted for the AFM head. The measuring data can be traceable through three laser interferometers in the system. The lateral scanning range can reach 25 mm × 25 mm by using a large-range positioning platform. A hybrid method combining AFM and white light scanning interferometry is proposed to improve the AFM measurement efficiency. In this method, the sample is measured firstly by white light scanning interferometry to get an overall coarse morphology, and then, further measured with higher resolution by AFM. Several measuring experiments on standard samples demonstrate the system’s good measurement performance and feasibility of the hybrid measurement method.
Keywords: atomic force microscope; self-sensing tuning fork probe; white light scanning interferometry; large-range positioning platform; hybrid measurement
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MDPI and ACS Style

Guo, T.; Wang, S.; Dorantes-Gonzalez, D.J.; Chen, J.; Fu, X.; Hu, X. Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry. Sensors 2012, 12, 175-188.

AMA Style

Guo T, Wang S, Dorantes-Gonzalez DJ, Chen J, Fu X, Hu X. Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry. Sensors. 2012; 12(1):175-188.

Chicago/Turabian Style

Guo, Tong; Wang, Siming; Dorantes-Gonzalez, Dante J.; Chen, Jinping; Fu, Xing; Hu, Xiaotang. 2012. "Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry." Sensors 12, no. 1: 175-188.

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