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Sensors 2011, 11(7), 7285-7301; doi:10.3390/s110707285

Electromechanical Impedance Response of a Cracked Timoshenko Beam

203 Office, Xi’an Research Institute of High-Technology, Xi’an 710025, China
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Received: 1 June 2011 / Revised: 16 July 2011 / Accepted: 17 July 2011 / Published: 22 July 2011
(This article belongs to the Section Physical Sensors)
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Abstract

Typically, the Electromechanical Impedance (EMI) technique does not use an analytical model for basic damage identification. However, an accurate model is necessary for getting more information about any damage. In this paper, an EMI model is presented for predicting the electromechanical impedance of a cracked beam structure quantitatively. A coupled system of a cracked Timoshenko beam with a pair of PZT patches bonded on the top and bottom surfaces has been considered, where the bonding layers are assumed as a Kelvin-Voigt material. The shear lag model is introduced to describe the load transfer between the PZT patches and the beam structure. The beam crack is simulated as a massless torsional spring; the dynamic equations of the coupled system are derived, which include the crack information and the inertial forces of both PZT patches and adhesive layers. According to the boundary conditions and continuity conditions, the analytical expression of the admittance of PZT patch is obtained. In the case study, the influences of crack and the inertial forces of PZT patches are analyzed. The results show that: (1) the inertial forces affects significantly in high frequency band; and (2) the use of appropriate frequency range can improve the accuracy of damage identification.
Keywords: electromechanical impedance; structural health monitoring; PZT; Timoshenko beam electromechanical impedance; structural health monitoring; PZT; Timoshenko beam
This is an open access article distributed under the Creative Commons Attribution License (CC BY 3.0).

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MDPI and ACS Style

Zhang, Y.; Xu, F.; Chen, J.; Wu, C.; Wen, D. Electromechanical Impedance Response of a Cracked Timoshenko Beam. Sensors 2011, 11, 7285-7301.

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