Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors
AbstractIn this paper, an industrially-oriented two-scale approach is provided to model the drop-induced brittle failure of polysilicon MEMS sensors. The two length-scales here investigated are the package (macroscopic) and the sensor (mesoscopic) ones. Issues related to the polysilicon morphology at the micro-scale are disregarded; an upscaled homogenized constitutive law, able to describe the brittle cracking of silicon, is instead adopted at the meso-scale. The two-scale approach is validated against full three-scale Monte-Carlo simulations, which allow for stochastic effects linked to the microstructural properties of polysilicon. Focusing on inertial MEMS sensors exposed to drops, it is shown that the offered approach matches well the experimentally observed failure mechanisms. View Full-Text
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Mariani, S.; Ghisi, A.; Corigliano, A.; Martini, R.; Simoni, B. Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors. Sensors 2011, 11, 4972-4989.
Mariani S, Ghisi A, Corigliano A, Martini R, Simoni B. Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors. Sensors. 2011; 11(5):4972-4989.Chicago/Turabian Style
Mariani, Stefano; Ghisi, Aldo; Corigliano, Alberto; Martini, Roberto; Simoni, Barbara. 2011. "Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors." Sensors 11, no. 5: 4972-4989.