Sensors 2011, 11(5), 4972-4989; doi:10.3390/s110504972
Article

Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors

1,* email, 1email, 1email, 1,†email and 2email
Received: 15 March 2011; in revised form: 28 April 2011 / Accepted: 3 May 2011 / Published: 4 May 2011
(This article belongs to the Special Issue Modeling, Testing and Reliability Issues in MEMS Engineering 2011)
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract: In this paper, an industrially-oriented two-scale approach is provided to model the drop-induced brittle failure of polysilicon MEMS sensors. The two length-scales here investigated are the package (macroscopic) and the sensor (mesoscopic) ones. Issues related to the polysilicon morphology at the micro-scale are disregarded; an upscaled homogenized constitutive law, able to describe the brittle cracking of silicon, is instead adopted at the meso-scale. The two-scale approach is validated against full three-scale Monte-Carlo simulations, which allow for stochastic effects linked to the microstructural properties of polysilicon. Focusing on inertial MEMS sensors exposed to drops, it is shown that the offered approach matches well the experimentally observed failure mechanisms.
Keywords: polysilicon MEMS; drops and shocks; brittle cracking; multi-scale simulations; finite element analysis
PDF Full-text Download PDF Full-Text [947 KB, uploaded 21 June 2014 03:42 CEST]

Export to BibTeX |
EndNote


MDPI and ACS Style

Mariani, S.; Ghisi, A.; Corigliano, A.; Martini, R.; Simoni, B. Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors. Sensors 2011, 11, 4972-4989.

AMA Style

Mariani S, Ghisi A, Corigliano A, Martini R, Simoni B. Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors. Sensors. 2011; 11(5):4972-4989.

Chicago/Turabian Style

Mariani, Stefano; Ghisi, Aldo; Corigliano, Alberto; Martini, Roberto; Simoni, Barbara. 2011. "Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors." Sensors 11, no. 5: 4972-4989.

Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert