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Journal: Sensors, 2011
Volume: 11
Number: 4972

Article: Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors
Authors: by Stefano Mariani, Aldo Ghisi, Alberto Corigliano, Roberto Martini and Barbara Simoni
Link: https://www.mdpi.com/1424-8220/11/5/4972

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