Next Article in Journal
A Gaussian Mixture Model-Based Continuous Boundary Detection for 3D Sensor Networks
Previous Article in Journal
Efficacy of a Computerized Sensor System for Evaluation and Training of Dizzy Patients
Article Menu

Export Article

Open AccessArticle
Sensors 2010, 10(8), 7621-7631; doi:10.3390/s100807621

Dynamic Uncertainty for Compensated Second-Order Systems

Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin, Germany;
*
Author to whom correspondence should be addressed.
Received: 10 June 2010 / Revised: 10 July 2010 / Accepted: 2 August 2010 / Published: 13 August 2010
(This article belongs to the Section Chemical Sensors)
View Full-Text   |   Download PDF [450 KB, uploaded 21 June 2014]   |  

Abstract

The compensation of LTI systems and the evaluation of the according uncertainty is of growing interest in metrology. Uncertainty evaluation in metrology ought to follow specific guidelines, and recently two corresponding uncertainty evaluation schemes have been proposed for FIR and IIR filtering. We employ these schemes to compare an FIR and an IIR approach for compensating a second-order LTI system which has relevance in metrology. Our results suggest that the FIR approach is superior in the sense that it yields significantly smaller uncertainties when real-time evaluation of uncertainties is desired. View Full-Text
Keywords: sensor; dynamic uncertainty; digital filter; deconvolution sensor; dynamic uncertainty; digital filter; deconvolution
This is an open access article distributed under the Creative Commons Attribution License (CC BY 3.0).

Scifeed alert for new publications

Never miss any articles matching your research from any publisher
  • Get alerts for new papers matching your research
  • Find out the new papers from selected authors
  • Updated daily for 49'000+ journals and 6000+ publishers
  • Define your Scifeed now

SciFeed Share & Cite This Article

MDPI and ACS Style

Eichstädt, S.; Link, A.; Elster, C. Dynamic Uncertainty for Compensated Second-Order Systems. Sensors 2010, 10, 7621-7631.

Show more citation formats Show less citations formats

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top