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Dynamic Uncertainty for Compensated Second-Order Systems
Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin, Germany;
* Author to whom correspondence should be addressed.
Received: 10 June 2010; in revised form: 10 July 2010 / Accepted: 2 August 2010 / Published: 13 August 2010
Abstract: The compensation of LTI systems and the evaluation of the according uncertainty is of growing interest in metrology. Uncertainty evaluation in metrology ought to follow specific guidelines, and recently two corresponding uncertainty evaluation schemes have been proposed for FIR and IIR filtering. We employ these schemes to compare an FIR and an IIR approach for compensating a second-order LTI system which has relevance in metrology. Our results suggest that the FIR approach is superior in the sense that it yields significantly smaller uncertainties when real-time evaluation of uncertainties is desired.
Keywords: sensor; dynamic uncertainty; digital filter; deconvolution
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Cite This Article
MDPI and ACS Style
Eichstädt, S.; Link, A.; Elster, C. Dynamic Uncertainty for Compensated Second-Order Systems. Sensors 2010, 10, 7621-7631.
Eichstädt S, Link A, Elster C. Dynamic Uncertainty for Compensated Second-Order Systems. Sensors. 2010; 10(8):7621-7631.
Eichstädt, Sascha; Link, Alfred; Elster, Clemens. 2010. "Dynamic Uncertainty for Compensated Second-Order Systems." Sensors 10, no. 8: 7621-7631.