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Detecting Nano-Scale Vibrations in Rotating Devices by Using Advanced Computational Methods
Centro de Automática y Robótica, Consejo Superior de Investigaciones Científicas, Ctra. Campo Real km 0.200, Arganda del Rey 28500, Madrid, Spain
Escuela Politécnica Superior, Universidad Autónoma de Madrid, C/ Francisco Tomás y Valiente 11 28049, Madrid, Spain
* Author to whom correspondence should be addressed.
Received: 3 March 2010; in revised form: 27 April 2010 / Accepted: 6 May 2010 / Published: 18 May 2010
Abstract: This paper presents a computational method for detecting vibrations related to eccentricity in ultra precision rotation devices used for nano-scale manufacturing. The vibration is indirectly measured via a frequency domain analysis of the signal from a piezoelectric sensor attached to the stationary component of the rotating device. The algorithm searches for particular harmonic sequences associated with the eccentricity of the device rotation axis. The detected sequence is quantified and serves as input to a regression model that estimates the eccentricity. A case study presents the application of the computational algorithm during precision manufacturing processes.
Keywords: vibration measurement; signal processing algorithm; frequency domain analysis; nanotechnology
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Cite This Article
MDPI and ACS Style
Del Toro, R.M.; Haber, R.E.; Schmittdiel, M.C. Detecting Nano-Scale Vibrations in Rotating Devices by Using Advanced Computational Methods. Sensors 2010, 10, 4983-4995.
Del Toro RM, Haber RE, Schmittdiel MC. Detecting Nano-Scale Vibrations in Rotating Devices by Using Advanced Computational Methods. Sensors. 2010; 10(5):4983-4995.
Del Toro, Raúl M.; Haber, Rodolfo E.; Schmittdiel, Michael C. 2010. "Detecting Nano-Scale Vibrations in Rotating Devices by Using Advanced Computational Methods." Sensors 10, no. 5: 4983-4995.