Sensors 2010, 10(5), 4983-4995; doi:10.3390/s100504983
Article

Detecting Nano-Scale Vibrations in Rotating Devices by Using Advanced Computational Methods

Received: 3 March 2010; in revised form: 27 April 2010 / Accepted: 6 May 2010 / Published: 18 May 2010
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract: This paper presents a computational method for detecting vibrations related to eccentricity in ultra precision rotation devices used for nano-scale manufacturing. The vibration is indirectly measured via a frequency domain analysis of the signal from a piezoelectric sensor attached to the stationary component of the rotating device. The algorithm searches for particular harmonic sequences associated with the eccentricity of the device rotation axis. The detected sequence is quantified and serves as input to a regression model that estimates the eccentricity. A case study presents the application of the computational algorithm during precision manufacturing processes.
Keywords: vibration measurement; signal processing algorithm; frequency domain analysis; nanotechnology
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MDPI and ACS Style

Del Toro, R.M.; Haber, R.E.; Schmittdiel, M.C. Detecting Nano-Scale Vibrations in Rotating Devices by Using Advanced Computational Methods. Sensors 2010, 10, 4983-4995.

AMA Style

Del Toro RM, Haber RE, Schmittdiel MC. Detecting Nano-Scale Vibrations in Rotating Devices by Using Advanced Computational Methods. Sensors. 2010; 10(5):4983-4995.

Chicago/Turabian Style

Del Toro, Raúl M.; Haber, Rodolfo E.; Schmittdiel, Michael C. 2010. "Detecting Nano-Scale Vibrations in Rotating Devices by Using Advanced Computational Methods." Sensors 10, no. 5: 4983-4995.

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