Conferences
14–17 September 2018, Kazan, Russia
16th Ieee East-West Design & Test Symposium (EWDTS 2018)
The Symposium will take place in Kazan – is the capital of Tatar Republic and one of the ancient cities in Russian Federation with more than 1000-year history, which situated on the bank of Volga River. Nowadays Kazan is the multinational, multireligious, scientific, educational, sport and cultural center. The Academy of Sciences of Tatarstan and the Kazan Scientific Centre of the Russian Academy of Sciences are situated in Kazan.
The main target of the IEEE East-West Design & Test Symposium (EWDTS) is to exchange experiences between scientists and technologies from Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic circuits and systems. The symposium is typically held in countries around East Europe, the Black Sea, the Balkans and Central Asia region. We cordially invite you to participate and submit your contributions to EWDTS-18, which covers (but is not limited to) the following topics:
• Analog, Mixed-Signal and RF Test
• ATPG and High-Level Test
• Automotive Reliability & Test
• Built-In Self Test
• Debug and Diagnosis
• Defect/Fault Tolerance and Reliability
• Design Verification and Validation
• EDA Tools for Design and Test
• Embedded Software
• Failure Analysis & Fault Modeling
• Functional Safely
• High-level Synthesis
• High-Performance Networks and Systems on a Chip
• Internet of Things Design & Test
• Low-power Design
• Memory and Processor Test
• Modeling & Fault Simulation
• Network-on-Chip Design & Test
• Flexible and Printed Electronics
• Applied Electronics – Automotive/Mechatronics
• Algorithms
• Object-Oriented System Specification and Design
• On-Line Testing
• Power Issues in Design & Test
• Real Time Embedded Systems
• Reliability of Digital Systems
• Scan-Based Techniques
• Self-Repair and Reconfigurable Architectures
• Signal and Information Processing in Radio and Communication
Engineering
• System Level Modeling, Simulation & Test Generation
• System-in-Package and 3D Design & Test
• Using UML for Embedded System Specification
• CAD and EDA Tools, Methods and Algorithms
• Hardware Security and Design for Security
• Logic, Schematic and System Synthesis
• Place and Route
• Thermal and Electrostatic Analysis of SoCs
• Wireless and RFID Systems Synthesis
• Sensors and Transducers
• Medical Electronics
• Design of Integrated Passive Components
Symposium Deadlines
Submission deadline: 15 June 2018
Notification of acceptance: 30 June 2018
Papers submission info: http://www.ewdtest.com/conf
The main target of the IEEE East-West Design & Test Symposium (EWDTS) is to exchange experiences between scientists and technologies from Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic circuits and systems. The symposium is typically held in countries around East Europe, the Black Sea, the Balkans and Central Asia region. We cordially invite you to participate and submit your contributions to EWDTS-18, which covers (but is not limited to) the following topics:
• Analog, Mixed-Signal and RF Test
• ATPG and High-Level Test
• Automotive Reliability & Test
• Built-In Self Test
• Debug and Diagnosis
• Defect/Fault Tolerance and Reliability
• Design Verification and Validation
• EDA Tools for Design and Test
• Embedded Software
• Failure Analysis & Fault Modeling
• Functional Safely
• High-level Synthesis
• High-Performance Networks and Systems on a Chip
• Internet of Things Design & Test
• Low-power Design
• Memory and Processor Test
• Modeling & Fault Simulation
• Network-on-Chip Design & Test
• Flexible and Printed Electronics
• Applied Electronics – Automotive/Mechatronics
• Algorithms
• Object-Oriented System Specification and Design
• On-Line Testing
• Power Issues in Design & Test
• Real Time Embedded Systems
• Reliability of Digital Systems
• Scan-Based Techniques
• Self-Repair and Reconfigurable Architectures
• Signal and Information Processing in Radio and Communication
Engineering
• System Level Modeling, Simulation & Test Generation
• System-in-Package and 3D Design & Test
• Using UML for Embedded System Specification
• CAD and EDA Tools, Methods and Algorithms
• Hardware Security and Design for Security
• Logic, Schematic and System Synthesis
• Place and Route
• Thermal and Electrostatic Analysis of SoCs
• Wireless and RFID Systems Synthesis
• Sensors and Transducers
• Medical Electronics
• Design of Integrated Passive Components
Symposium Deadlines
Submission deadline: 15 June 2018
Notification of acceptance: 30 June 2018
Papers submission info: http://www.ewdtest.com/conf
