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Journal: Electronics, 2020
Volume: 9
Number: 2095

Article: Hot Carrier Stress Sensing Bulk Current for 28 nm Stacked High-k nMOSFETs
Authors: by Chii-Wen Chen, Mu-Chun Wang, Cheng-Hsun-Tony Chang, Wei-Lun Chu, Shun-Ping Sung and Wen-How Lan
Link: https://www.mdpi.com/2079-9292/9/12/2095

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