Diagnosis of Faults Induced by Radiation and Circuit-Level Design Mitigation Techniques: Experience from VCO and High-Speed Driver CMOS ICs Case Studies
Abstract
:1. Introduction
2. Radiation Effect on MOSFET Devices
2.1. Single-Event Effects
2.2. Total Ionising Dose Effects
3. TID and SEE in Simulation-before-Test
3.1. Drivers for Electro-Optical Modulators
3.2. Voltage-Controlled Oscillator
4. RHBD Mitigation Techniques
4.1. Drivers for Electro-Optical Modulators
4.2. Voltage-Controlled Oscillator
5. Conclusions
Author Contributions
Funding
Conflicts of Interest
References
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Control Voltage | Clock Cycles | Frequency Variations | Amplitude Variations | |
---|---|---|---|---|
hit1 | 0 | 15 | 1.24% | 43.8% |
VDD/2 | 26 | 5.58% | 48.82% | |
VDD | 24 | 2.45% | 57.49% | |
hit2 | 0 | 6 | 0.11% | 1.55% |
VDD/2 | 12 | 0.5% | 3.85% | |
VDD | 13 | 0.46% | 3.17% |
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Monda, D.; Ciarpi, G.; Saponara, S. Diagnosis of Faults Induced by Radiation and Circuit-Level Design Mitigation Techniques: Experience from VCO and High-Speed Driver CMOS ICs Case Studies. Electronics 2021, 10, 2144. https://doi.org/10.3390/electronics10172144
Monda D, Ciarpi G, Saponara S. Diagnosis of Faults Induced by Radiation and Circuit-Level Design Mitigation Techniques: Experience from VCO and High-Speed Driver CMOS ICs Case Studies. Electronics. 2021; 10(17):2144. https://doi.org/10.3390/electronics10172144
Chicago/Turabian StyleMonda, Danilo, Gabriele Ciarpi, and Sergio Saponara. 2021. "Diagnosis of Faults Induced by Radiation and Circuit-Level Design Mitigation Techniques: Experience from VCO and High-Speed Driver CMOS ICs Case Studies" Electronics 10, no. 17: 2144. https://doi.org/10.3390/electronics10172144