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Appl. Sci. 2017, 7(6), 592; doi:10.3390/app7060592

Photon Beam Transport and Scientific Instruments at the European XFEL

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany
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Academic Editor: Kiyoshi Ueda
Received: 1 May 2017 / Revised: 31 May 2017 / Accepted: 1 June 2017 / Published: 9 June 2017
(This article belongs to the Special Issue X-Ray Free-Electron Laser)
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Abstract

European XFEL is a free-electron laser (FEL) user facility providing soft and hard X-ray FEL radiation to initially six scientific instruments. Starting user operation in fall 2017 European XFEL will provide new research opportunities to users from science domains as diverse as physics, chemistry, geo- and planetary sciences, materials sciences or biology. The unique feature of European XFEL is the provision of high average brilliance in the soft and hard X-ray regime, combined with the pulse properties of FEL radiation of extreme peak intensities, femtosecond pulse duration and high degree of coherence. The high average brilliance is achieved through acceleration of up to 27,000 electron bunches per second by the super-conducting electron accelerator. Enabling the usage of this high average brilliance in user experiments is one of the major instrumentation drivers for European XFEL. The radiation generated by three FEL sources is distributed via long beam transport systems to the experiment hall where the scientific instruments are located side-by-side. The X-ray beam transport systems have been optimized to maintain the unique features of the FEL radiation which will be monitored using build-in photon diagnostics. The six scientific instruments are optimized for specific applications using soft or hard X-ray techniques and include integrated lasers, dedicated sample environment, large area high frame rate detector(s) and computing systems capable of processing large quantities of data. View Full-Text
Keywords: free-electron lasers; average brilliance; peak brilliance; photon diagnostics; X-ray optics; femtosecond time resolution; coherent X-ray diffraction imaging; ultrafast diffraction; ultrafast absorption and emission spectroscopy; non-linear X-ray processes free-electron lasers; average brilliance; peak brilliance; photon diagnostics; X-ray optics; femtosecond time resolution; coherent X-ray diffraction imaging; ultrafast diffraction; ultrafast absorption and emission spectroscopy; non-linear X-ray processes
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Tschentscher, T.; Bressler, C.; Grünert, J.; Madsen, A.; Mancuso, A.P.; Meyer, M.; Scherz, A.; Sinn, H.; Zastrau, U. Photon Beam Transport and Scientific Instruments at the European XFEL. Appl. Sci. 2017, 7, 592.

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