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Atmosphere 2015, 6(9), 1327-1345; doi:10.3390/atmos6091327

An Overview of Particulate Matter Measurement Instruments

1
Department of Energy, UNESP—Univ Estadual Paulista, Guaratinguetá , SP 12516-410, Brazil
2
Department of Biochemistry and Chemical Technology, Institute of Chemistry, UNESP—Univ Estadual Paulista, Araraquara, SP 14800-060, Brazil
3
Department of Logistic, Federal Institute of Education, Science and Technology of São Paulo, Jacareí, SP 12322-030, Brazil
*
Author to whom correspondence should be addressed.
Academic Editor: Pasquale Avino
Received: 27 June 2015 / Revised: 5 August 2015 / Accepted: 1 September 2015 / Published: 9 September 2015
(This article belongs to the Special Issue Indoor and Outdoor Air Quality)
View Full-Text   |   Download PDF [445 KB, uploaded 9 September 2015]   |  

Abstract

This review article presents an overview of instruments available on the market for measurement of particulate matter. The main instruments and methods of measuring concentration (gravimetric, optical, and microbalance) and size distribution Scanning Mobility Particle Sizer (SMPS), Electrical Low Pressure Impactor (ELPI), and others were described and compared. The aim of this work was to help researchers choose the most suitable equipment to measure particulate matter. When choosing a measuring instrument, a researcher must clearly define the purpose of the study and determine whether it meets the main specifications of the equipment. ELPI and SMPS are the suitable devices for measuring fine particles; the ELPI works in real time. In health-related studies, a Diffusion Charger is the instrument that best characterizes the surface of ultrafine particles. Several methods and different particle measuring instruments should be used to confirm the values obtained during sampling. View Full-Text
Keywords: particle matter emissions; sampling; pollution; measurement instruments particle matter emissions; sampling; pollution; measurement instruments
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Amaral, S.S.; de Carvalho, J.A., Jr.; Costa, M.A.M.; Pinheiro, C. An Overview of Particulate Matter Measurement Instruments. Atmosphere 2015, 6, 1327-1345.

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