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Materials 2016, 9(8), 649; doi:10.3390/ma9080649

The Sulphur Poisoning Behaviour of Gadolinia Doped Ceria Model Systems in Reducing Atmospheres

1
Institute of Chemical Technologies and Analytics, TU Wien, Getreidemarkt 9/164-EC, Vienna A-1060, Austria
2
Christian Doppler Laboratory for Interfaces in Metal-Supported Electrochemical Energy Converters, Getreidemarkt 9/164-EC, Vienna 1060, Austria
3
Central Facility for Electron Microscopy (GFE), RWTH Aachen University, Ahornstraße 55, Aachen 52074, Germany
4
Plansee SE, Innovation Services, Reutte 6600, Austria
5
Forschungszentrum Jülich GmbH, Institute of Energy and Climate Research, Materials Synthesis and Processing (IEK-1), Jülich 52425, Germany
*
Authors to whom correspondence should be addressed.
Academic Editor: Norbert H. Menzler
Received: 10 June 2016 / Revised: 7 July 2016 / Accepted: 12 July 2016 / Published: 2 August 2016
(This article belongs to the Special Issue Recent Advances in Materials for Solid Oxide Cells)
View Full-Text   |   Download PDF [4757 KB, uploaded 2 August 2016]   |  

Abstract

An array of analytical methods including surface area determination by gas adsorption using the Brunauer, Emmett, Teller (BET) method, combustion analysis, XRD, ToF-SIMS, TEM and impedance spectroscopy has been used to investigate the interaction of gadolinia doped ceria (GDC) with hydrogen sulphide containing reducing atmospheres. It is shown that sulphur is incorporated into the GDC bulk and might lead to phase changes. Additionally, high concentrations of silicon are found on the surface of model composite microelectrodes. Based on these data, a model is proposed to explain the multi-facetted electrochemical degradation behaviour encountered during long term electrochemical measurements. While electrochemical bulk properties of GDC stay largely unaffected, the surface polarisation resistance is dramatically changed, due to silicon segregation and reaction with adsorbed sulphur. View Full-Text
Keywords: ceria; sulphur poisoning; SOFC anode; electrochemical impedance spectroscopy; ToF-SIMS; microelectrodes; XRD; XPS; BET; TEM ceria; sulphur poisoning; SOFC anode; electrochemical impedance spectroscopy; ToF-SIMS; microelectrodes; XRD; XPS; BET; TEM
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Gerstl, M.; Nenning, A.; Iskandar, R.; Rojek-Wöckner, V.; Bram, M.; Hutter, H.; Opitz, A.K. The Sulphur Poisoning Behaviour of Gadolinia Doped Ceria Model Systems in Reducing Atmospheres. Materials 2016, 9, 649.

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