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Materials 2016, 9(5), 349; doi:10.3390/ma9050349

In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement

ITACA Institute, Universitat Politècnica de València, Camino de Vera s/n, Valencia 46022, Spain
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Academic Editor: Dinesh Agrawal
Received: 29 February 2016 / Revised: 19 April 2016 / Accepted: 28 April 2016 / Published: 7 May 2016
(This article belongs to the Special Issue Microwave Materials Processing)
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Abstract

Microwave-assisted processes have recognized advantages over more conventional heating techniques. However, the effects on the materials’ microstructure are still a matter of study, due to the complexity of the interaction between microwaves and matter, especially at high temperatures. Recently developed advanced microwave instrumentation allows the study of high temperature microwave heating processes in a way that was not possible before. In this paper, different materials and thermal processes induced by microwaves have been studied through the in situ characterization of their dielectric properties with temperature. This knowledge is crucial in several aspects: to analyze the effects of the microwave field on the reaction pathways; to design and optimize microwave-assisted processes, and to predict the behavior of materials leading to repeatable and reliable heating processes, etc. View Full-Text
Keywords: microwave; high temperature; process monitoring; dielectric properties; heating; ceramic materials microwave; high temperature; process monitoring; dielectric properties; heating; ceramic materials
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Garcia-Baños, B.; Catalá-Civera, J.M.; Peñaranda-Foix, F.L.; Plaza-González, P.; Llorens-Vallés, G. In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement. Materials 2016, 9, 349.

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