Materials 2013, 6(9), 4096-4108; doi:10.3390/ma6094096
Article

Complete Permittivity Tensor in Sputtered CuFe2O4 Thin Films at Photon Energies between 2 and 5 eV

1 Faculty of Mathematics and Physics, Charles University in Prague, Prague 12116, Czech Republic 2 Department of Physics, Indian Institute of Technology, Bombay 400076, India 3 Department of Metallurgical Engineering & Material Science, Indian Institute of Technology,Bombay 400076, India 4 Faculty of Chemical Technology, Univerzity of Pardubice, Pardubice 53210, Czech Republic 5 Groupe d'Etude de la Matiére Condensée, CNRS, Université Versailles St. Quentin, F-78035Versailles, France
* Author to whom correspondence should be addressed.
Received: 26 July 2013; in revised form: 19 August 2013 / Accepted: 26 August 2013 / Published: 16 September 2013
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Abstract: This work is devoted to the systematic study of the optical and magneto-optical properties of sputter deposited CuFe2O4 thin films in the photon energy region between 2 and 5 eV using spectroscopic ellipsometry and magneto-optical Kerr spectroscopy. The spectral dependence of both the diagonal and off-diagonal elements of the permittivity tensor is determined. A complete picture about the electron transitions in CuFe2O4 is suggested in the frame of intervalence charge transfer and intersublattice charge transfer transitions. The effect of deposition conditions and post-deposition treatment in CuFe2O4 films upon the optical and magneto-optical properties is discussed.
Keywords: spectroscopic ellipsometry; magneto-optics; spinel ferrite; CuFe2O4; permittivity tensor

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MDPI and ACS Style

Veis, M.; Antos, R.; Visnovsky, S.; Kulkarni, P.D.; Venkataramani, N.; Prasad, S.; Mistrik, J.; Krishnan, R. Complete Permittivity Tensor in Sputtered CuFe2O4 Thin Films at Photon Energies between 2 and 5 eV. Materials 2013, 6, 4096-4108.

AMA Style

Veis M, Antos R, Visnovsky S, Kulkarni PD, Venkataramani N, Prasad S, Mistrik J, Krishnan R. Complete Permittivity Tensor in Sputtered CuFe2O4 Thin Films at Photon Energies between 2 and 5 eV. Materials. 2013; 6(9):4096-4108.

Chicago/Turabian Style

Veis, Martin; Antos, Roman; Visnovsky, Stefan; Kulkarni, Prasanna D.; Venkataramani, Narayanan; Prasad, Shiva; Mistrik, Jan; Krishnan, Ramanathan. 2013. "Complete Permittivity Tensor in Sputtered CuFe2O4 Thin Films at Photon Energies between 2 and 5 eV." Materials 6, no. 9: 4096-4108.

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