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Journal: Materials, 2012
Volume: 5
Page(s): 364-376
364-376
Article: X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La₂Zr₂O₇ Buffer Layer Capacity
Narayanan, V.; de Buysser, K.; Bruneel, E.; Driessche, I.

http://www.mdpi.com/1996-1944/5/3/364

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