Sensors 2009, 9(9), 7021-7037; doi:10.3390/s90907021

On-Line Metrology with Conoscopic Holography: Beyond Triangulation

1 University of Oviedo, Dept. Electrical Engineering. Campus de Viesques s/n, 33204 Gijón, Spain 2 DSIPlus, Cirujeda 12, Bajo, 33205 Gijón, Spain
* Author to whom correspondence should be addressed.
Received: 23 July 2009; in revised form: 26 August 2009 / Accepted: 28 August 2009 / Published: 4 September 2009
(This article belongs to the Special Issue State-of-the-Art Sensors Technology in Spain)
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Abstract: On-line non-contact surface inspection with high precision is still an open problem. Laser triangulation techniques are the most common solution for this kind of systems, but there exist fundamental limitations to their applicability when high precisions, long standoffs or large apertures are needed, and when there are difficult operating conditions. Other methods are, in general, not applicable in hostile environments or inadequate for on-line measurement. In this paper we review the latest research in Conoscopic Holography, an interferometric technique that has been applied successfully in this kind of applications, ranging from submicrometric roughness measurements, to long standoff sensors for surface defect detection in steel at high temperatures.
Keywords: optical metrology; conoscopic holography; industrial inspection

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MDPI and ACS Style

Álvarez, I.; Enguita, J.M.; Frade, M.; Marina, J.; Ojea, G. On-Line Metrology with Conoscopic Holography: Beyond Triangulation. Sensors 2009, 9, 7021-7037.

AMA Style

Álvarez I, Enguita JM, Frade M, Marina J, Ojea G. On-Line Metrology with Conoscopic Holography: Beyond Triangulation. Sensors. 2009; 9(9):7021-7037.

Chicago/Turabian Style

Álvarez, Ignacio; Enguita, Jose M.; Frade, María; Marina, Jorge; Ojea, Guillermo. 2009. "On-Line Metrology with Conoscopic Holography: Beyond Triangulation." Sensors 9, no. 9: 7021-7037.

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