Sensors 2007, 7(9), 1817-1833; doi:10.3390/s7081817

Multi-scale Analysis of MEMS Sensors Subject to Drop Impacts

1,* email, 1email, 1email and 2email
Received: 30 August 2007; Accepted: 6 September 2007 / Published: 7 September 2007
(This article belongs to the Special Issue Modeling, Testing and Reliability Issues in MEMS Engineering)
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract: The effect of accidental drops on MEMS sensors are examined within the frame-work of a multi-scale finite element approach. With specific reference to a polysilicon MEMSaccelerometer supported by a naked die, the analysis is decoupled into macro-scale (at dielength-scale) and meso-scale (at MEMS length-scale) simulations, accounting for the verysmall inertial contribution of the sensor to the overall dynamics of the device. Macro-scaleanalyses are adopted to get insights into the link between shock waves caused by the impactagainst a target surface and propagating inside the die, and the displacement/acceleration his-tories at the MEMS anchor points. Meso-scale analyses are adopted to detect the most stresseddetails of the sensor and to assess whether the impact can lead to possible localized failures.Numerical results show that the acceleration at sensor anchors cannot be considered an ob-jective indicator for drop severity. Instead, accurate analyses at sensor level are necessary toestablish how MEMS can fail because of drops.
Keywords: polysilicon MEMS; drop test; multi-scale finite element analysis.
PDF Full-text Download PDF Full-Text [1199 KB, uploaded 21 June 2014 00:58 CEST]

Export to BibTeX |

MDPI and ACS Style

Mariani, S.; Ghisi, A.; Corigliano, A.; Zerbini, S. Multi-scale Analysis of MEMS Sensors Subject to Drop Impacts. Sensors 2007, 7, 1817-1833.

AMA Style

Mariani S, Ghisi A, Corigliano A, Zerbini S. Multi-scale Analysis of MEMS Sensors Subject to Drop Impacts. Sensors. 2007; 7(9):1817-1833.

Chicago/Turabian Style

Mariani, Stefano; Ghisi, Aldo; Corigliano, Alberto; Zerbini, Sarah. 2007. "Multi-scale Analysis of MEMS Sensors Subject to Drop Impacts." Sensors 7, no. 9: 1817-1833.

Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert