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Journal: Sensors, 2016
Volume: 16
Number: 1178
Article:
Defect Detection in Textures through the Use of Entropy as a Means for Automatically Selecting the Wavelet Decomposition Level
Authors:
by
Pedro J. Navarro, Carlos Fernández-Isla, Pedro María Alcover and Juan Suardíaz
Link:
https://www.mdpi.com/1424-8220/16/8/1178
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